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dc.contributor.authorElishco, Ohad
dc.contributor.authorGabrys, Ryan
dc.contributor.authorYaakobi, Eitan
dc.contributor.authorMedard, Muriel
dc.date.accessioned2021-11-08T16:46:03Z
dc.date.available2021-11-08T15:54:53Z
dc.date.available2021-11-08T16:46:03Z
dc.date.issued2019-07
dc.identifier.urihttps://hdl.handle.net/1721.1/137690.2
dc.description.abstract© 2019 IEEE. In this paper we consider the problem of encoding data into repeat-free sequences in which sequences are imposed to contain any k-tuple at most once (for predefined k). First, the capacity and redundancy of the repeat-free constraint are calculated. Then, an efficient algorithm, which uses a single bit of redundancy, is presented to encode length-n sequences for k = 2 + 2 log n. This algorithm is then improved to support any value of k of the form k = a log n, for 1 a ≤ 2, while its redundancy is o(n). Lastly, we also calculate the capacity of this constraint when combined with local constraints which are given by a constrained system.en_US
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionof10.1109/ISIT.2019.8849483en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleRepeat-Free Codesen_US
dc.typeArticleen_US
dc.identifier.citation2019. "Repeat-Free Codes." IEEE International Symposium on Information Theory - Proceedings, 2019-July.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.relation.journalIEEE International Symposium on Information Theory - Proceedingsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2021-03-09T17:04:26Z
dspace.orderedauthorsElishco, O; Gabrys, R; Medard, M; Yaakobi, Een_US
dspace.date.submission2021-03-09T17:04:27Z
mit.journal.volume2019-Julyen_US
mit.licenseOPEN_ACCESS_POLICY
mit.metadata.statusPublication Information Neededen_US


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