| dc.contributor.author | Gao, Zhengqi | |
| dc.contributor.author | Zhang, Dinghuai | |
| dc.contributor.author | Daniel, Luca | |
| dc.contributor.author | Boning, Duane | |
| dc.date.accessioned | 2024-12-04T19:58:09Z | |
| dc.date.available | 2024-12-04T19:58:09Z | |
| dc.date.issued | 2024-06-23 | |
| dc.identifier.isbn | 979-8-4007-0601-1 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/157751 | |
| dc.description | DAC ’24, June 23–27, 2024, San Francisco, CA, USA | en_US |
| dc.publisher | ACM|61st ACM/IEEE Design Automation Conference | en_US |
| dc.relation.isversionof | https://doi.org/10.1145/3649329.3658459 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | ACM | en_US |
| dc.title | NOFIS: Normalizing Flow for Rare Circuit Failure Analysis | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Accurate estimation of rare failure occurrence probability is crucial for ensuring the proper and reliable functioning of integrated circuits (ICs). Conventional Monte Carlo methods are inefficient, demanding an exorbitant number of samples to achieve reliable estimates. Inspired by the exact sampling capabilities of normalizing flows, we revisit this problem and propose normalizing flow assisted importance sampling, termed NOFIS. NOFIS first learns a sequence of proposal distributions associated with predefined nested subset events by minimizing KL divergence losses. Next, it estimates the rare event probability by utilizing importance sampling in conjunction with the last proposal. The efficacy of our NOFIS method is substantiated through comprehensive qualitative visualizations, affirming the optimality of the learned proposal distribution, as well as 10 quantitative experiments, which highlight NOFIS's superior accuracy over baseline approaches. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.identifier.mitlicense | PUBLISHER_CC | |
| dc.identifier.mitlicense | PUBLISHER_CC | |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2024-12-01T08:45:31Z | |
| dc.language.rfc3066 | en | |
| dc.rights.holder | The author(s) | |
| dspace.date.submission | 2024-12-01T08:45:32Z | |
| mit.license | PUBLISHER_POLICY | |
| mit.metadata.status | Authority Work and Publication Information Needed | en_US |
