Show simple item record

dc.contributor.authorYip, Sidneyen_US
dc.contributor.authorPowell, Adam C.en_US
dc.contributor.authorBazant, Martin Z.en_US
dc.contributor.authorCarter, W. Craigen_US
dc.contributor.authorMarzari, Nicolaen_US
dc.contributor.authorRosales, Rodolfoen_US
dc.contributor.authorWhite, Jacob K.en_US
dc.contributor.authorCao, Jianshuen_US
dc.contributor.authorHadjiconstantinou, Nicolas G (Nicholas George)en_US
dc.contributor.authorMirny, Leonid A.en_US
dc.contributor.authorTrout, Bernhardt L.en_US
dc.contributor.authorUlm, F.-J. (Franz-Josef)en_US
dc.coverage.temporalSpring 2002en_US
dc.date.issued2002-06
dc.identifier22.00J-Spring2002
dc.identifierlocal: 22.00J
dc.identifierlocal: 1.021J
dc.identifierlocal: 3.021J
dc.identifierlocal: 10.333J
dc.identifierlocal: 18.361J
dc.identifierlocal: 2.030J
dc.identifierlocal: HST.558
dc.identifierlocal: IMSCP-MD5-17568691ed2fe71a9147c3563480b7f2
dc.identifier.urihttp://hdl.handle.net/1721.1/35256
dc.description.abstractBasic concepts of computer modeling in science and engineering using discrete particle systems and continuum fields. Techniques and software for statistical sampling, simulation, data analysis and visualization. Use of statistical, quantum chemical, molecular dynamics, Monte Carlo, mesoscale and continuum methods to study fundamental physical phenomena encountered in the fields of computational physics, chemistry, mechanics, materials science, biology, and applied mathematics. Applications drawn from a range of disciplines to build a broad-based understanding of complex structures and interactions in problems where simulation is on equal-footing with theory and experiment. Term project allows development of individual interest. Student mentoring by a coordinated team of participating faculty from across the Institute.en_US
dc.format.extent16720 bytesen_US
dc.format.extent14340 bytesen_US
dc.format.extent15675 bytesen_US
dc.format.extent17050 bytesen_US
dc.format.extent14792 bytesen_US
dc.format.extent14076 bytesen_US
dc.format.extent17967 bytesen_US
dc.format.extent11 bytesen_US
dc.format.extent4586 bytesen_US
dc.format.extent21366 bytesen_US
dc.format.extent11602 bytesen_US
dc.format.extent38351 bytesen_US
dc.format.extent4755 bytesen_US
dc.format.extent27322 bytesen_US
dc.format.extent25313 bytesen_US
dc.format.extent4039 bytesen_US
dc.format.extent301 bytesen_US
dc.format.extent354 bytesen_US
dc.format.extent339 bytesen_US
dc.format.extent180 bytesen_US
dc.format.extent285 bytesen_US
dc.format.extent67 bytesen_US
dc.format.extent17685 bytesen_US
dc.format.extent49 bytesen_US
dc.format.extent143 bytesen_US
dc.format.extent247 bytesen_US
dc.format.extent19283 bytesen_US
dc.format.extent262 bytesen_US
dc.format.extent46031 bytesen_US
dc.format.extent744007 bytesen_US
dc.format.extent2479620 bytesen_US
dc.format.extent96041 bytesen_US
dc.format.extent186488 bytesen_US
dc.format.extent210185 bytesen_US
dc.format.extent453511 bytesen_US
dc.format.extent943814 bytesen_US
dc.format.extent210520 bytesen_US
dc.format.extent263691 bytesen_US
dc.format.extent120269 bytesen_US
dc.format.extent291580 bytesen_US
dc.format.extent200025 bytesen_US
dc.format.extent522748 bytesen_US
dc.format.extent487138 bytesen_US
dc.format.extent1450239 bytesen_US
dc.format.extent65991 bytesen_US
dc.format.extent167278 bytesen_US
dc.format.extent73426 bytesen_US
dc.format.extent97685 bytesen_US
dc.format.extent101740 bytesen_US
dc.format.extent92302 bytesen_US
dc.format.extent260302 bytesen_US
dc.format.extent19283 bytesen_US
dc.format.extent3486 bytesen_US
dc.format.extent811 bytesen_US
dc.format.extent813 bytesen_US
dc.format.extent830 bytesen_US
dc.format.extent550 bytesen_US
dc.format.extent2097 bytesen_US
dc.format.extent39848 bytesen_US
dc.format.extent12657 bytesen_US
dc.format.extent12123 bytesen_US
dc.format.extent12658 bytesen_US
dc.format.extent12697 bytesen_US
dc.format.extent12121 bytesen_US
dc.format.extent12225 bytesen_US
dc.format.extent12666 bytesen_US
dc.format.extent12679 bytesen_US
dc.format.extent12252 bytesen_US
dc.format.extent12637 bytesen_US
dc.format.extent12660 bytesen_US
dc.format.extent12632 bytesen_US
dc.format.extent12638 bytesen_US
dc.format.extent12651 bytesen_US
dc.format.extent12651 bytesen_US
dc.format.extent13013 bytesen_US
dc.format.extent12640 bytesen_US
dc.format.extent12668 bytesen_US
dc.format.extent12649 bytesen_US
dc.format.extent12113 bytesen_US
dc.format.extent12641 bytesen_US
dc.format.extent12630 bytesen_US
dc.format.extent13293 bytesen_US
dc.format.extent12140 bytesen_US
dc.format.extent12661 bytesen_US
dc.format.extent12656 bytesen_US
dc.format.extent12629 bytesen_US
dc.format.extent12757 bytesen_US
dc.format.extent12641 bytesen_US
dc.format.extent12644 bytesen_US
dc.languageen-USen_US
dc.rights.uriUsage Restrictions: This site (c) Massachusetts Institute of Technology 2003. Content within individual courses is (c) by the individual authors unless otherwise noted. The Massachusetts Institute of Technology is providing this Work (as defined below) under the terms of this Creative Commons public license ("CCPL" or "license"). The Work is protected by copyright and/or other applicable law. Any use of the work other than as authorized under this license is prohibited. By exercising any of the rights to the Work provided here, You (as defined below) accept and agree to be bound by the terms of this license. The Licensor, the Massachusetts Institute of Technology, grants You the rights contained here in consideration of Your acceptance of such terms and conditions.en_US
dc.subjectQuantumen_US
dc.subjectModelingen_US
dc.subjectvisualizationen_US
dc.subjectdata analysisen_US
dc.subjectsimulationen_US
dc.subjectstatistical samplingen_US
dc.subject22.00Jen_US
dc.subject1.021Jen_US
dc.subject3.021Jen_US
dc.subject10.333Jen_US
dc.subject18.361Jen_US
dc.subject2.030Jen_US
dc.subjectHST.558en_US
dc.subject22.00en_US
dc.subject1.021en_US
dc.subject3.021en_US
dc.subject10.333en_US
dc.subject18.361en_US
dc.subject2.030en_US
dc.subjectSimulation methodsen_US
dc.subjectMathematical modelsen_US
dc.title22.00J / 1.021J / 3.021J / 10.333J / 18.361J / 2.030J / HST.558 Introduction to Modeling and Simulation, Spring 2002en_US
dc.title.alternativeIntroduction to Modeling and Simulationen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record