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Synchrotron X-Ray Studies of Surface Disordering

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Synchrotron X-Ray Studies of Surface Disordering

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Author: Birgeneau, Robert J.; Wells, Barry; Ramstad, Monte J.; Young, Michael J.; Martin, Debra L.
Publisher: Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Date Issued: 1995-01-01
Description:
Contains table of contents for Section 4, an introduction, reports on two research projects and a list of publications.
URI: http://hdl.handle.net/1721.1/57343
Other Identifiers: RLE_PR_138_01_04s_01
Is Part Of: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1995
Solid State Physics, Electronics and Optics
Surfaces and Interfaces
Synchrotron X-Ray Studies of Surface Disordering
Series/Report no.: Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 138
Keywords: Synchrotron X-Ray Studies of Surface Disordering, Stability of Vicinal Si(111) Surfaces Under Sublimation, Stability of Vicinal Si(111) Surfaces Under Electromigration, Monolayer Melting

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