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dc.contributor.authorBirgeneau, Robert J.en_US
dc.contributor.authorWells, Barryen_US
dc.contributor.authorRamstad, Monte J.en_US
dc.contributor.authorYoung, Michael J.en_US
dc.contributor.authorMartin, Debra L.en_US
dc.date.accessioned2010-07-16T21:51:09Z
dc.date.available2010-07-16T21:51:09Z
dc.date.issued1995-01-01 to 1995-12-31en_US
dc.identifierRLE_PR_138_01_04s_01en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57343
dc.descriptionContains table of contents for Section 4, an introduction, reports on two research projects and a list of publications.en_US
dc.description.sponsorshipJoint Services Electronics Program Grant DAAH04-95-1-0038en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1995en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofSurfaces and Interfacesen_US
dc.relation.ispartofSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 138en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.subject.otherStability of Vicinal Si(111) Surfaces Under Sublimationen_US
dc.subject.otherStability of Vicinal Si(111) Surfaces Under Electromigrationen_US
dc.subject.otherMonolayer Meltingen_US
dc.titleSynchrotron X-Ray Studies of Surface Disorderingen_US
dc.typeTechnical Reporten_US


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