dc.contributor.author | Birgeneau, Robert J. | en_US |
dc.contributor.author | Wells, Barry | en_US |
dc.contributor.author | Ramstad, Monte J. | en_US |
dc.contributor.author | Young, Michael J. | en_US |
dc.contributor.author | Martin, Debra L. | en_US |
dc.date.accessioned | 2010-07-16T21:51:09Z | |
dc.date.available | 2010-07-16T21:51:09Z | |
dc.date.issued | 1995-01-01 to 1995-12-31 | en_US |
dc.identifier | RLE_PR_138_01_04s_01 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/57343 | |
dc.description | Contains table of contents for Section 4, an introduction, reports on two research projects and a list of publications. | en_US |
dc.description.sponsorship | Joint Services Electronics Program Grant DAAH04-95-1-0038 | en_US |
dc.language.iso | en | en_US |
dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1995 | en_US |
dc.relation.ispartof | Solid State Physics, Electronics and Optics | en_US |
dc.relation.ispartof | Surfaces and Interfaces | en_US |
dc.relation.ispartof | Synchrotron X-Ray Studies of Surface Disordering | en_US |
dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 138 | en_US |
dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
dc.subject.other | Synchrotron X-Ray Studies of Surface Disordering | en_US |
dc.subject.other | Stability of Vicinal Si(111) Surfaces Under Sublimation | en_US |
dc.subject.other | Stability of Vicinal Si(111) Surfaces Under Electromigration | en_US |
dc.subject.other | Monolayer Melting | en_US |
dc.title | Synchrotron X-Ray Studies of Surface Disordering | en_US |
dc.type | Technical Report | en_US |