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dc.contributor.authordel Alamo, Jesús A.en_US
dc.contributor.authorSomerville, Mark H.en_US
dc.contributor.authorErnst, Alexander N.en_US
dc.contributor.authorNici, Kathleen A.en_US
dc.date.accessioned2010-07-17T01:41:13Z
dc.date.available2010-07-17T01:41:13Z
dc.date.issued1997-01-01 to 1997-12-31en_US
dc.identifierRLE_PR_140_01_01s_02en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57427
dc.descriptionContains an introduction, reports on three research projects, research conclusions and a list of publications.en_US
dc.description.sponsorshipJoint Services Electronics Program Contract DAAHO4-95-1-0038en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1997en_US
dc.relation.ispartofSolid State Physics, Electronics and Opticsen_US
dc.relation.ispartofMaterials and Fabricationen_US
dc.relation.ispartofPhysics of InAIAs/InGaAs Heterostructure Field-Effect Transistorsen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 140en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherPhysics of InAIAs/InGaAs Heterostructure Field-Effect Transistorsen_US
dc.subject.otherNew Measurement Technique for On-State Breakdown Voltageen_US
dc.subject.otherOn-State Breakdown Physicsen_US
dc.subject.otherNew Model for On-state Breakdown Voltageen_US
dc.titlePhysics of InAIAs/InGaAs Heterostructure Field-Effect Transistorsen_US
dc.typeTechnical Reporten_US


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