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dc.contributor.authorFisher, Peter H.
dc.contributor.authorCowan, Ray Franklin
dc.contributor.authorDujmic, Denis
dc.contributor.authorHenderson, Shawn Wesley
dc.contributor.authorSciolla, Gabriella
dc.contributor.authorSpitznagel, M.
dc.contributor.authorYamamoto, R. K.
dc.contributor.authorZhao, M.
dc.date.accessioned2010-07-23T20:25:28Z
dc.date.available2010-07-23T20:25:28Z
dc.date.issued2009-10
dc.date.submitted2009-08
dc.identifier.issn1550-7998
dc.identifier.urihttp://hdl.handle.net/1721.1/57458
dc.description.abstractWe measure the rate of D0-D[over-bar] 0 mixing with the observable yCP=(τKpi/τKK)-1, where τKK and τKpi are, respectively, the mean lifetimes of CP-even D0-->K+K- and CP-mixed D0-->K-pi+ decays, using a data sample of 384  fb[superscript -1] collected by the BABAR detector at the SLAC PEP-II asymmetric-energy B Factory. From a sample of D0 and D̅ 0 decays where the initial flavor of the decaying meson is not determined, we obtain yCP=[1.12±0.26(stat)±0.22(syst)]%, which excludes the no-mixing hypothesis at 3.3σ, including both statistical and systematic uncertainties. This result is in good agreement with a previous BABAR measurement of yCP obtained from a sample of D*+-->D0pi+ events, where the D0 decays to K-pi+, K+K-, and pi+pi-, which is disjoint with the untagged D0 events used here. Combining the two results taking into account statistical and systematic uncertainties, where the systematic uncertainties are assumed to be 100% correlated, we find yCP=[1.16±0.22(stat)±0.18(syst)]%, which excludes the no-mixing hypothesis at 4.1σ.en_US
dc.description.sponsorshipUnited States Department of Energyen_US
dc.description.sponsorshipNational Science Foundationen_US
dc.description.sponsorshipNatural Sciences and Engineering Research Council of Canadaen_US
dc.description.sponsorshipCommissariat à l'Energie Atomique (France)en_US
dc.description.sponsorshipInstitut National de Physique Nucleaire et Physique des Particules/CNRSen_US
dc.description.sponsorshipBundesministerium für Bildung und Forschung, Germanyen_US
dc.description.sponsorshipDeutsche Forschungsgemeinschaften_US
dc.description.sponsorshipIstituto Nazionale di Fisica Nucleare of Italyen_US
dc.description.sponsorshipFOM of the Netherlandsen_US
dc.description.sponsorshipNorges forskningsråden_US
dc.description.sponsorshipMinistry of Education and Science of the Russian Federationen_US
dc.description.sponsorshipMinisterio de Ciencia e Innovación, Spainen_US
dc.description.sponsorshipScience and Technology Facilities Council, United Kingdomen_US
dc.language.isoen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevD.80.071103en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleMeasurement of D-D-bar mixing using the ratio of lifetimes for the decays D-->K- pi + and K+K-en_US
dc.title.alternativeMeasurement of D0-D̅ 0 mixing using the ratio of lifetimes for the decays D0→K-π+ and K+K-en_US
dc.typeArticleen_US
dc.identifier.citationBABAR Collaboration et al. “Measurement of D-D-bar mixing using the ratio of lifetimes for the decays D-->K- pi + and K+K-.” Physical Review D 80.7 (2009): 071103. © 2009 The American Physical Society.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.approverFisher, Peter H.
dc.contributor.mitauthorFisher, Peter H.
dc.contributor.mitauthorCowan, Ray Franklin
dc.contributor.mitauthorDujmic, Denis
dc.contributor.mitauthorHenderson, Shawn Wesley
dc.contributor.mitauthorSciolla, Gabriella
dc.contributor.mitauthorSpitznagel, M.
dc.contributor.mitauthorYamamoto, R. K.
dc.contributor.mitauthorZhao, M.
dc.relation.journalPhysical Review Den_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsAubert, B.; Karyotakis, Y.; Lees, J.; Poireau, V.; Prencipe, E.; Prudent, X.; Tisserand, V.; Tico, J.; Grauges, E.; Martinelli, M.; Palano, A.; Pappagallo, M.; Eigen, G.; Stugu, B.; Sun, L.; Battaglia, M.; Brown, D.; Hooberman, B.; Kerth, L.; Kolomensky, Yu.; Lynch, G.; Osipenkov, I.; Tackmann, K.; Tanabe, T.; Hawkes, C.; Soni, N.; Watson, A.; Koch, H.; Schroeder, T.; Asgeirsson, D.; Hearty, C.; Mattison, T.; McKenna, J.; Barrett, M.; Khan, A.; Randle-Conde, A.; Blinov, V.; Bukin, A.; Buzykaev, A.; Druzhinin, V.; Golubev, V.; Onuchin, A.; Serednyakov, S.; Skovpen, Yu.; Solodov, E.; Todyshev, K.; Bondioli, M.; Curry, S.; Eschrich, I.; Kirkby, D.; Lankford, A.; Lund, P.; Mandelkern, M.; Martin, E.; Stoker, D.; Atmacan, H.; Gary, J.; Liu, F.; Long, O.; Vitug, G.; Yasin, Z.; Sharma, V.; Campagnari, C.; Hong, T.; Kovalskyi, D.; Mazur, M.; Richman, J.; Beck, T.; Eisner, A.; Heusch, C.; Kroseberg, J.; Lockman, W.; Martinez, A.; Schalk, T.; Schumm, B.; Seiden, A.; Wang, L.; Winstrom, L.; Cheng, C.; Doll, D.; Echenard, B.; Fang, F.; Hitlin, D.; Narsky, I.; Ongmongkolkul, P.; Piatenko, T.; Porter, F.; Andreassen, R.; Mancinelli, G.; Meadows, B.; Mishra, K.; Sokoloff, M.; Bloom, P.; Ford, W.; Gaz, A.; Hirschauer, J.; Nagel, M.; Nauenberg, U.; Smith, J.; Wagner, S.; Ayad, R.; Toki, W.; Wilson, R.; Feltresi, E.; Hauke, A.; Jasper, H.; Karbach, T.; Merkel, J.; Petzold, A.; Spaan, B.; Wacker, K.; Kobel, M.; Nogowski, R.; Schubert, K.; Schwierz, R.; Bernard, D.; Latour, E.; Verderi, M.; Clark, P.; Playfer, S.; Watson, J.; Andreotti, M.; Bettoni, D.; Bozzi, C.; Calabrese, R.; Cecchi, A.; Cibinetto, G.; Fioravanti, E.; Franchini, P.; Luppi, E.; Munerato, M.; Negrini, M.; Petrella, A.; Piemontese, L.; Santoro, V.; Baldini-Ferroli, R.; Calcaterra, A.; de Sangro, R.; Finocchiaro, G.; Pacetti, S.; Patteri, P.; Peruzzi, I.; Piccolo, M.; Rama, M.; Zallo, A.; Contri, R.; Guido, E.; Lo Vetere, M.; Monge, M.; Passaggio, S.; Patrignani, C.; Robutti, E.; Tosi, S.; Chaisanguanthum, K.; Morii, M.; Adametz, A.; Marks, J.; Schenk, S.; Uwer, U.; Bernlochner, F.; Klose, V.; Lacker, H.; Lueck, T.; Volk, A.; Bard, D.; Dauncey, P.; Tibbetts, M.; Behera, P.; Charles, M.; Mallik, U.; Cochran, J.; Crawley, H.; Dong, L.; Eyges, V.; Meyer, W.; Prell, S.; Rosenberg, E.; Rubin, A.; Gao, Y.; Gritsan, A.; Guo, Z.; Arnaud, N.; Béquilleux, J.; D’Orazio, A.; Davier, M.; Derkach, D.; da Costa, J.; Grosdidier, G.; Le Diberder, F.; Lepeltier, V.; Lutz, A.; Malaescu, B.; Pruvot, S.; Roudeau, P.; Schune, M.; Serrano, J.; Sordini, V.; Stocchi, A.; Wormser, G.; Lange, D.; Wright, D.; Bingham, I.; Burke, J.; Chavez, C.; Fry, J.; Gabathuler, E.; Gamet, R.; Hutchcroft, D.; Payne, D.; Touramanis, C.; Bevan, A.; Clarke, C.; Di Lodovico, F.; Sacco, R.; Sigamani, M.; Cowan, G.; Paramesvaran, S.; Wren, A.; Brown, D.; Davis, C.; Denig, A.; Fritsch, M.; Gradl, W.; Hafner, A.; Alwyn, K.; Bailey, D.; Barlow, R.; Jackson, G.; Lafferty, G.; West, T.; Yi, J.; Anderson, J.; Chen, C.; Jawahery, A.; Roberts, D.; Simi, G.; Tuggle, J.; Dallapiccola, C.; Salvati, E.; Cowan, R.; Dujmic, D.; Fisher, P.; Henderson, S.; Sciolla, G.; Spitznagel, M.; Yamamoto, R.; Zhao, M.; Patel, P.; Robertson, S.; Schram, M.; Biassoni, P.; Lazzaro, A.; Lombardo, V.; Palombo, F.; Stracka, S.; Cremaldi, L.; Godang, R.; Kroeger, R.; Sonnek, P.; Summers, D.; Zhao, H.; Simard, M.; Taras, P.; Nicholson, H.; De Nardo, G.; Lista, L.; Monorchio, D.; Onorato, G.; Sciacca, C.; Raven, G.; Snoek, H.; Jessop, C.; Knoepfel, K.; LoSecco, J.; Wang, W.; Corwin, L.; Honscheid, K.; Kagan, H.; Kass, R.; Morris, J.; Rahimi, A.; Sekula, S.; Wong, Q.; Blount, N.; Brau, J.; Frey, R.; Igonkina, O.; Kolb, J.; Lu, M.; Rahmat, R.; Sinev, N.; Strom, D.; Strube, J.; Torrence, E.; Castelli, G.; Gagliardi, N.; Margoni, M.; Morandin, M.; Posocco, M.; Rotondo, M.; Simonetto, F.; Stroili, R.; Voci, C.; del Amo Sanchez, P.; Ben-Haim, E.; Bonneaud, G.; Briand, H.; Chauveau, J.; Hamon, O.; Leruste, Ph.; Marchiori, G.; Ocariz, J.; Perez, A.; Prendki, J.; Sitt, S.; Gladney, L.; Biasini, M.; Manoni, E.; Angelini, C.; Batignani, G.; Bettarini, S.; Calderini, G.; Carpinelli, M.; Cervelli, A.; Forti, F.; Giorgi, M.; Lusiani, A.; Morganti, M.; Neri, N.; Paoloni, E.; Rizzo, G.; Walsh, J.; Pegna, D.; Lu, C.; Olsen, J.; Smith, A.; Telnov, A.; Anulli, F.; Baracchini, E.; Cavoto, G.; Faccini, R.; Ferrarotto, F.; Ferroni, F.; Gaspero, M.; Jackson, P.; Gioi, L.; Mazzoni, M.; Morganti, S.; Piredda, G.; Renga, F.; Voena, C.; Ebert, M.; Hartmann, T.; Schröder, H.; Waldi, R.; Adye, T.; Franek, B.; Olaiya, E.; Wilson, F.; Emery, S.; Esteve, L.; de Monchenault, G.; Kozanecki, W.; Vasseur, G.; Yèche, Ch.; Zito, M.; Allen, M.; Aston, D.; Bartoldus, R.; Benitez, J.; Cenci, R.; Coleman, J.; Convery, M.; Dingfelder, J.; Dorfan, J.; Dubois-Felsmann, G.; Dunwoodie, W.; Field, R.; Sevilla, M.; Fulsom, B.; Gabareen, A.; Graham, M.; Grenier, P.; Hast, C.; Innes, W.; Kaminski, J.; Kelsey, M.; Kim, H.; Kim, P.; Kocian, M.; Leith, D.; Li, S.; Lindquist, B.; Luitz, S.; Luth, V.; Lynch, H.; MacFarlane, D.; Marsiske, H.; Messner, R.; Muller, D.; Neal, H.; Nelson, S.; O’Grady, C.; Ofte, I.; Perl, M.; Ratcliff, B.; Roodman, A.; Salnikov, A.; Schindler, R.; Schwiening, J.; Snyder, A.; Su, D.; Sullivan, M.; Suzuki, K.; Swain, S.; Thompson, J.; Va’vra, J.; Wagner, A.; Weaver, M.; West, C.; Wisniewski, W.; Wittgen, M.; Wright, D.; Wulsin, H.; Yarritu, A.; Young, C.; Ziegler, V.; Chen, X.; Liu, H.; Park, W.; Purohit, M.; White, R.; Wilson, J.; Bellis, M.; Burchat, P.; Edwards, A.; Miyashita, T.; Ahmed, S.; Alam, M.; Ernst, J.; Pan, B.; Saeed, M.; Zain, S.; Soffer, A.; Spanier, S.; Wogsland, B.; Eckmann, R.; Ritchie, J.; Ruland, A.; Schilling, C.; Schwitters, R.; Wray, B.; Drummond, B.; Izen, J.; Lou, X.; Bianchi, F.; Gamba, D.; Pelliccioni, M.; Bomben, M.; Bosisio, L.; Cartaro, C.; Della Ricca, G.; Lanceri, L.; Vitale, L.; Azzolini, V.; Lopez-March, N.; Martinez-Vidal, F.; Milanes, D.; Oyanguren, A.; Albert, J.; Banerjee, Sw.; Bhuyan, B.; Choi, H.; Hamano, K.; King, G.; Kowalewski, R.; Lewczuk, M.; Nugent, I.; Roney, J.; Sobie, R.; Gershon, T.; Harrison, P.; Ilic, J.; Latham, T.; Mohanty, G.; Puccio, E.; Band, H.; Chen, X.; Dasu, S.; Flood, K.; Pan, Y.; Prepost, R.; Vuosalo, C.; Wu, S.en
dc.identifier.orcidhttps://orcid.org/0000-0002-8667-5660
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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