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dc.contributor.authorRiklin-Raviv, Tammy
dc.contributor.authorSochen, Nir
dc.contributor.authorKiryati, Nahum
dc.date.accessioned2010-12-14T19:59:03Z
dc.date.available2010-12-14T19:59:03Z
dc.date.issued2009-08
dc.date.submitted2009-05
dc.identifier.issn0162-8828
dc.identifier.otherINSPEC Accession Number: 10721314
dc.identifier.urihttp://hdl.handle.net/1721.1/60292
dc.description.abstractWe introduce a novel variational method for the extraction of objects with either bilateral or rotational symmetry in the presence of perspective distortion. Information on the symmetry axis of the object and the distorting transformation is obtained as a by-product of the segmentation process. The key idea is the use of a flip or a rotation of the image to segment as if it were another view of the object. We call this generated image the symmetrical counterpart image. We show that the symmetrical counterpart image and the source image are related by planar projective homography. This homography is determined by the unknown planar projective transformation that distorts the object symmetry. The proposed segmentation method uses a level-set-based curve evolution technique. The extraction of the object boundaries is based on the symmetry constraint and the image data. The symmetrical counterpart of the evolving level-set function provides a dynamic shape prior. It supports the segmentation by resolving possible ambiguities due to noise, clutter, occlusions, and assimilation with the background. The homography that aligns the symmetrical counterpart to the source level-set is recovered via a registration process carried out concurrently with the segmentation. Promising segmentation results of various images of approximately symmetrical objects are shown.en_US
dc.description.sponsorshipMUSCLE Network of Excellenceen_US
dc.description.sponsorshipYizhak and Chaya Weinstein Research Institute for Signal Processingen_US
dc.description.sponsorshipUniversiṭat Tel-Aviv. A.M.N. Foundationen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/tpami.2008.160en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleOn Symmetry, Perspectivity, and Level-Set-Based Segmentationen_US
dc.typeArticleen_US
dc.identifier.citationRiklin-Raviv, T., N. Sochen, and N. Kiryati. “On Symmetry, Perspectivity, and Level-Set-Based Segmentation.” Pattern Analysis and Machine Intelligence, IEEE Transactions on 31.8 (2009): 1458-1471. © 2009 IEEE.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverRiklin-Raviv, Tammy
dc.contributor.mitauthorRiklin-Raviv, Tammy
dc.relation.journalIEEE Transactions on Pattern Analysis and Machine Intelligenceen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsRiklin-Raviv, T.; Sochen, N.; Kiryati, N.en
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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