dc.contributor.author | Taff, Brian M. | |
dc.contributor.author | Desai, Salil P. | |
dc.contributor.author | Voldman, Joel | |
dc.date.accessioned | 2011-01-07T20:33:30Z | |
dc.date.available | 2011-01-07T20:33:30Z | |
dc.date.issued | 2009-02 | |
dc.date.submitted | 2008-12 | |
dc.identifier.issn | 1077-3118 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/60409 | |
dc.description.abstract | We present a platform for parallelized manipulations of individual polarizable micron-scale particles (i.e., microparticles) that combines negative dielectrophoretic forcing with the passive capture of hydrodynamic weir-based trapping. Our work enables manipulations using ejection- and/or exclusion-based methods. In ejection operations, we unload targeted weirs by displacing microparticles from their capture faces via electrode activation. In exclusion-based operations, we prevent weir loading by activating selected on-chip electrodes before introducing microparticles into the system. Our work describes the device’s passive loading dynamics and demonstrates enhanced functionalities by forming a variety of particle patterns. | en_US |
dc.description.sponsorship | National Institutes of Health (U.S.) (Contract No. RR19652) | en_US |
dc.description.sponsorship | Singapore-MIT Alliance | en_US |
dc.language.iso | en_US | |
dc.publisher | American Institute of Physics | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1063/1.3085955 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | MIT web domain | en_US |
dc.title | Electroactive hydrodynamic weirs for microparticle manipulation and patterning | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Taff, Brian M., Salil P. Desai, and Joel Voldman. “Electroactive hydrodynamic weirs for microparticle manipulation and patterning.” Applied Physics Letters 94.8 (2009): 084102-3. © 2009 American Institute of Physics. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.approver | Voldman, Joel | |
dc.contributor.mitauthor | Voldman, Joel | |
dc.contributor.mitauthor | Taff, Brian M. | |
dc.contributor.mitauthor | Desai, Salil P. | |
dc.relation.journal | Applied Physical Letters | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Taff, Brian M.; Desai, Salil P.; Voldman, Joel | en |
dc.identifier.orcid | https://orcid.org/0000-0001-8898-2296 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |