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Charge transport in mixed CdSe and CdTe colloidal nanocrystal films

dc.contributor.authorBawendi, Moungi G.
dc.contributor.authorGeyer, Scott Mitchell
dc.contributor.authorPorter, Venda J.
dc.contributor.authorHalpert, Jonathan E.
dc.contributor.authorMentzel, Tamar
dc.contributor.authorKastner, Marc
dc.date.accessioned2011-02-04T15:43:38Z
dc.date.available2011-02-04T15:43:38Z
dc.date.issued2010-10
dc.date.submitted2010-08
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1721.1/60897
dc.description.abstractWe report the influence of trap states on charge transport through films of mixed CdTe and CdSe nanocrystals (NCs) between lateral electrodes, through layered films of CdTe and CdSe NCs in a layered geometry, and through films of CdTe/CdSe nanobarbells in a layered geometry. We find that an electron trapping state on the surface of the CdTe NCs dominates the conduction in all devices studied. X-ray photoelectron spectroscopy and thermal activation studies implicate unpassivated or oxidized Te as the electron-trapping site.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (MRSEC program (Grant No. DMR-0819762))en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Award No. PHY-0646094)en_US
dc.description.sponsorshipMIT/Army Institute for Soldier Nanotechnologies (Contract No. W911NF-07-D-004)en_US
dc.description.sponsorshipUnited States. Dept. of Energy (Grant No. DE-FG36-08G018007)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.82.155201en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleCharge transport in mixed CdSe and CdTe colloidal nanocrystal filmsen_US
dc.typeArticleen_US
dc.identifier.citationGeyer, Scott et al. “Charge transport in mixed CdSe and CdTe colloidal nanocrystal films.” Physical Review B 82.15 (2010): 155201. © 2010 The American Physical Society.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.approverBawendi, Moungi G.
dc.contributor.mitauthorBawendi, Moungi G.
dc.contributor.mitauthorGeyer, Scott Mitchell
dc.contributor.mitauthorPorter, Venda J.
dc.contributor.mitauthorHalpert, Jonathan E.
dc.contributor.mitauthorMentzel, Tamar
dc.contributor.mitauthorKastner, Marc
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsGeyer, Scott; Porter, Venda; Halpert, Jonathan; Mentzel, Tamar; Kastner, Marc; Bawendi, Moungien
dc.identifier.orcidhttps://orcid.org/0000-0001-7641-5438
dc.identifier.orcidhttps://orcid.org/0000-0003-4422-3313
dc.identifier.orcidhttps://orcid.org/0000-0003-2220-4365
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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