New Measurement of the π0 [pi superscript 0] Radiative Decay Width
dc.contributor.author | McNulty, Daniel D. | |
dc.contributor.author | Prok, Yelena | |
dc.contributor.author | Bernstein, Aron M. | |
dc.contributor.author | Kingsberry, P. | |
dc.contributor.author | Kowalski, Stanley B. | |
dc.date.accessioned | 2011-09-29T22:15:37Z | |
dc.date.available | 2011-09-29T22:15:37Z | |
dc.date.issued | 2011-04 | |
dc.date.submitted | 2010-09 | |
dc.identifier.issn | 0031-9007 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/66123 | |
dc.description.abstract | High precision measurements of the differential cross sections for π0 [pi superscript 0] photoproduction at forward angles for two nuclei, 12C [superscript 12 C] and 208Pb [superscript 208 Pb], have been performed for incident photon energies of 4.9–5.5 GeV to extract the π0→γγ [pi superscript 0 → gamma gamma] decay width. The experiment was done at Jefferson Lab using the Hall B photon tagger and a high-resolution multichannel calorimeter. The π0→γγ [pi superscript 0 → gamma gamma] decay width was extracted by fitting the measured cross sections using recently updated theoretical models for the process. The resulting value for the decay width is Γ(π0→γγ)[Gamma (pi superscript 0 → gamma gamma)] =7.82±0.14(stat)±0.17(syst) eV. With the 2.8% total uncertainty, this result is a factor of 2.5 more precise than the current Particle Data Group average of this fundamental quantity, and it is consistent with current theoretical predictions. | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Major Research Instrumentation Grant PHY-0079840) | en_US |
dc.description.sponsorship | United States. Dept. of Energy (Contract no. DE-AC05-84ER40150) | en_US |
dc.language.iso | en_US | |
dc.publisher | American Physical Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevLett.106.162303 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | APS | en_US |
dc.title | New Measurement of the π0 [pi superscript 0] Radiative Decay Width | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Larin, I. et al. “New Measurement of the π^{0} Radiative Decay Width.” Physical Review Letters 106, 162303 (2011): n. pag. © 2011 American Physical Society | en_US |
dc.contributor.department | Lincoln Laboratory | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Physics | en_US |
dc.contributor.approver | Kowalski, Stanley B. | |
dc.contributor.mitauthor | McNulty, Daniel D. | |
dc.contributor.mitauthor | Prok, Yelena | |
dc.contributor.mitauthor | Bernstein, Aron M. | |
dc.contributor.mitauthor | Kingsberry, P. | |
dc.contributor.mitauthor | Kowalski, Stanley B. | |
dc.relation.journal | Physical review letters | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Larin, I.; McNulty, D.; Clinton, E.; Ambrozewicz, P.; Lawrence, D.; Nakagawa, I.; Prok, Y.; Teymurazyan, A.; Ahmidouch, A.; Asratyan, A.; Baker, K.; Benton, L.; Bernstein, A.; Burkert, V.; Cole, P.; Collins, P.; Dale, D.; Danagoulian, S.; Davidenko, G.; Demirchyan, R.; Deur, A.; Dolgolenko, A.; Dzyubenko, G.; Ent, R.; Evdokimov, A.; Feng, J.; Gabrielyan, M.; Gan, L.; Gasparian, A.; Gevorkyan, S.; Glamazdin, A.; Goryachev, V.; Gyurjyan, V.; Hardy, K.; He, J.; Ito, M.; Jiang, L.; Kashy, D.; Khandaker, M.; Kingsberry, P.; Kolarkar, A.; Konchatnyi, M.; Korchin, A.; Korsch, W.; Kowalski, S.; Kubantsev, M.; Kubarovsky, V.; Li, X.; Martel, P.; Matveev, V.; Mecking, B.; Milbrath, B.; Minehart, R.; Miskimen, R.; Mochalov, V.; Mtingwa, S.; Overby, S.; Pasyuk, E.; Payen, M.; Pedroni, R.; Ritchie, B.; Rodrigues, T.; Salgado, C.; Shahinyan, A.; Sitnikov, A.; Sober, D.; Stepanyan, S.; Stephens, W.; Underwood, J.; Vasiliev, A.; Vishnyakov, V.; Wood, M.; Zhou, S. | en |
dc.identifier.orcid | https://orcid.org/0000-0003-3088-6060 | |
dc.identifier.orcid | https://orcid.org/0000-0002-5665-3081 | |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete |