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dc.contributor.authorPan, Z. -H.
dc.contributor.authorFedorov, A. V.
dc.contributor.authorGardner, Dillon Richard
dc.contributor.authorLee, Young S.
dc.contributor.authorChu, S.
dc.contributor.authorValla, T.
dc.date.accessioned2012-07-13T13:39:11Z
dc.date.available2012-07-13T13:39:11Z
dc.date.issued2012-05
dc.date.submitted2011-05
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.urihttp://hdl.handle.net/1721.1/71615
dc.description.abstractGapless surface states on topological insulators are protected from elastic scattering on nonmagnetic impurities which makes them promising candidates for low-power electronic applications. However, for widespread applications, these states should have to remain coherent at ambient temperatures. Here, we studied temperature dependence of the electronic structure and the scattering rates on the surface of a model topological insulator, Bi[subscript 2]Se[aubscript 3], by high-resolution angle-resolved photoemission spectroscopy. We found an extremely weak broadening of the topological surface state with temperature and no anomalies in the state’s dispersion, indicating exceptionally weak electron-phonon coupling. Our results demonstrate that the topological surface state is protected not only from elastic scattering on impurities, but also from scattering on low-energy phonons, suggesting that topological insulators could serve as a basis for room-temperature electronic devices.en_US
dc.description.sponsorshipUnited States. Dept. of Energy (Grant No. DE-FG02-04ER46134)en_US
dc.description.sponsorshipUnited States. Dept. of Energy (Contract No. DE-AC03- 76SF00098)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.108.187001en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleMeasurement of an Exceptionally Weak Electron-Phonon Coupling on the Surface of the Topological Insulator Bi[subscript 2]Se[subscript 3] Using Angle-Resolved Photoemission Spectroscopyen_US
dc.typeArticleen_US
dc.identifier.citationPan, Z.-H. et al. “Measurement of an Exceptionally Weak Electron-Phonon Coupling on the Surface of the Topological Insulator Bi[subscript 2]Se[subscript 3] Using Angle-Resolved Photoemission Spectroscopy.” Physical Review Letters 108.18 (2012). © 2012 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.approverLee, Young S.
dc.contributor.mitauthorGardner, Dillon Richard
dc.contributor.mitauthorLi, Young S.
dc.contributor.mitauthorChu, S.
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsPan, Z.-H.; Fedorov, A.; Gardner, D.; Lee, Y.; Chu, S.; Valla, T.en
dc.identifier.orcidhttps://orcid.org/0000-0003-2226-6443
dc.identifier.orcidhttps://orcid.org/0000-0002-7022-8313
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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