Enhanced solid-state multispin metrology using dynamical decoupling
Author(s)
Cappellaro, Paola; Pham, L. M.; Bar-Gill, N.; Belthangady, C.; Sage, D. Le; Lukin, M. D.; Yacoby, A.; Walsworth, R. L.; ... Show more Show less![Thumbnail](/bitstream/handle/1721.1/74504/Pham-2012-Enhanced%20solid-state%20multispin%20metrology%20using%20dynamical%20decoupling.pdf.jpg?sequence=6&isAllowed=y)
DownloadPham-2012-Enhanced solid-state multispin metrology using dynamical decoupling.pdf (568.2Kb)
PUBLISHER_POLICY
Publisher Policy
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Terms of use
Metadata
Show full item recordAbstract
We use multipulse dynamical decoupling to increase the coherence lifetime (T[subscript 2]) of large numbers of nitrogen-vacancy (NV) electronic spins in room temperature diamond, thus enabling scalable applications of multispin quantum information processing and metrology. We realize an order-of-magnitude extension of the NV multispin T[subscript 2] in three diamond samples with widely differing spin impurity environments. In particular, for samples with nitrogen impurity concentration ≲1 ppm, we extend T[subscript 2] to >2 ms, comparable to the longest coherence time reported for single NV centers, and demonstrate a tenfold enhancement in NV multispin sensing of ac magnetic fields.
Date issued
2012-07Department
Massachusetts Institute of Technology. Department of Nuclear Science and EngineeringJournal
Physical Review B
Publisher
American Physical Society
Citation
Pham, L. et al. “Enhanced Solid-state Multispin Metrology Using Dynamical Decoupling.” Physical Review B 86.4 (2012). ©2012 American Physical Society
Version: Final published version
ISSN
1098-0121
1550-235X