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Microfluidic genome-wide profiling of intrinsic electrical properties in Saccharomyces cerevisiae

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dc.contributor.author Vahey, Michael D.
dc.contributor.author Quiros Pesudo, Laia
dc.contributor.author Svensson, J. Peter
dc.contributor.author Samson, Leona D.
dc.contributor.author Voldman, Joel
dc.date.accessioned 2014-08-22T15:42:11Z
dc.date.available 2014-08-22T15:42:11Z
dc.date.issued 2013-04
dc.date.submitted 2013-02
dc.identifier.issn 1473-0197
dc.identifier.issn 1473-0189
dc.identifier.uri http://hdl.handle.net/1721.1/88978
dc.description.abstract Methods to analyze the intrinsic physical properties of cells – for example, size, density, rigidity, or electrical properties – are an active area of interest in the microfluidics community. Although the physical properties of cells are determined at a fundamental level by gene expression, the relationship between the two remains exceptionally complex and poorly characterized, limiting the adoption of intrinsic separation technologies. To improve our current understanding of how a cell's genotype maps to a measurable physical characteristic and quantitatively investigate the potential of using these characteristics as biomarkers, we have developed a novel screen that combines microfluidic cell sorting with high-throughput sequencing and the haploid yeast deletion library to identify genes whose functions modulate one such characteristic – intrinsic electrical properties. Using this screen, we are able to establish a high-content electrical profile of the haploid yeast gene deletion strains. We find that individual genetic deletions can appreciably alter the electrical properties of cells, affecting [approximately] 10% of the 4432 gene deletion strains screened. Additionally, we find that gene deletions affecting electrical properties in specific ways (i.e. increasing or decreasing effective conductivity at higher or lower electric field frequencies) are strongly associated with an enriched subset of fundamental biological processes that can be traced to specific pathways and complexes. The screening approach demonstrated here and the attendant results are immediately applicable to the intrinsic separations community. en_US
dc.description.sponsorship Singapore-MIT Alliance en_US
dc.description.sponsorship National Science Foundation (U.S.) (NSF IDBR grant DBI-0852654) en_US
dc.description.sponsorship National Institutes of Health (U.S.) (NIH grant EB005753) en_US
dc.language.iso en_US
dc.publisher Royal Society of Chemistry en_US
dc.relation.isversionof http://dx.doi.org/10.1039/c3lc50162k en_US
dc.rights Creative Commons Attribution-Noncommercial-Share Alike en_US
dc.rights.uri http://creativecommons.org/licenses/by-nc-sa/4.0/ en_US
dc.source PMC en_US
dc.title Microfluidic genome-wide profiling of intrinsic electrical properties in Saccharomyces cerevisiae en_US
dc.type Article en_US
dc.identifier.citation Vahey, Michael D., Laia Quiros Pesudo, J. Peter Svensson, Leona D. Samson, and Joel Voldman. “Microfluidic Genome-Wide Profiling of Intrinsic Electrical Properties in Saccharomyces Cerevisiae.” Lab Chip 13, no. 14 (2013): 2754. en_US
dc.contributor.department Massachusetts Institute of Technology. Department of Biology en_US
dc.contributor.department Massachusetts Institute of Technology. Center for Environmental Health Sciences en_US
dc.contributor.department David H. Koch Institute for Integrative Cancer Research at MIT en_US
dc.contributor.department Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science en_US
dc.contributor.department Massachusetts Institute of Technology. Department of Biological Engineering en_US
dc.contributor.mitauthor Vahey, Michael D. en_US
dc.contributor.mitauthor Quiros Pesudo, Laia en_US
dc.contributor.mitauthor Samson, Leona D. en_US
dc.contributor.mitauthor Voldman, Joel en_US
dc.relation.journal Lab on a Chip en_US
dc.identifier.mitlicense OPEN_ACCESS_POLICY en_US
dc.eprint.version Author's final manuscript en_US
dc.type.uri http://purl.org/eprint/type/JournalArticle en_US
eprint.status http://purl.org/eprint/status/PeerReviewed en_US
dspace.orderedauthors Vahey, Michael D.; Quiros Pesudo, Laia; Svensson, J. Peter; Samson, Leona D.; Voldman, Joel en_US
dc.identifier.orcid https://orcid.org/0000-0001-8898-2296
dc.identifier.orcid https://orcid.org/0000-0002-7112-1454


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