Show simple item record

dc.contributor.authorVahey, Michael D.
dc.contributor.authorQuiros Pesudo, Laia
dc.contributor.authorSvensson, J. Peter
dc.contributor.authorVoldman, Joel
dc.contributor.authorSamson, Leona D
dc.date.accessioned2014-08-22T15:42:11Z
dc.date.available2014-08-22T15:42:11Z
dc.date.issued2013-04
dc.date.submitted2013-02
dc.identifier.issn1473-0197
dc.identifier.issn1473-0189
dc.identifier.urihttp://hdl.handle.net/1721.1/88978
dc.description.abstractMethods to analyze the intrinsic physical properties of cells – for example, size, density, rigidity, or electrical properties – are an active area of interest in the microfluidics community. Although the physical properties of cells are determined at a fundamental level by gene expression, the relationship between the two remains exceptionally complex and poorly characterized, limiting the adoption of intrinsic separation technologies. To improve our current understanding of how a cell's genotype maps to a measurable physical characteristic and quantitatively investigate the potential of using these characteristics as biomarkers, we have developed a novel screen that combines microfluidic cell sorting with high-throughput sequencing and the haploid yeast deletion library to identify genes whose functions modulate one such characteristic – intrinsic electrical properties. Using this screen, we are able to establish a high-content electrical profile of the haploid yeast gene deletion strains. We find that individual genetic deletions can appreciably alter the electrical properties of cells, affecting [approximately] 10% of the 4432 gene deletion strains screened. Additionally, we find that gene deletions affecting electrical properties in specific ways (i.e. increasing or decreasing effective conductivity at higher or lower electric field frequencies) are strongly associated with an enriched subset of fundamental biological processes that can be traced to specific pathways and complexes. The screening approach demonstrated here and the attendant results are immediately applicable to the intrinsic separations community.en_US
dc.description.sponsorshipSingapore-MIT Allianceen_US
dc.description.sponsorshipNational Science Foundation (U.S.) (NSF IDBR grant DBI-0852654)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (NIH grant EB005753)en_US
dc.language.isoen_US
dc.publisherRoyal Society of Chemistryen_US
dc.relation.isversionofhttp://dx.doi.org/10.1039/c3lc50162ken_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcePMCen_US
dc.titleMicrofluidic genome-wide profiling of intrinsic electrical properties in Saccharomyces cerevisiaeen_US
dc.typeArticleen_US
dc.identifier.citationVahey, Michael D., Laia Quiros Pesudo, J. Peter Svensson, Leona D. Samson, and Joel Voldman. “Microfluidic Genome-Wide Profiling of Intrinsic Electrical Properties in Saccharomyces Cerevisiae.” Lab Chip 13, no. 14 (2013): 2754.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Center for Environmental Health Sciencesen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Biological Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Biologyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentKoch Institute for Integrative Cancer Research at MITen_US
dc.contributor.mitauthorVahey, Michael D.en_US
dc.contributor.mitauthorQuiros Pesudo, Laiaen_US
dc.contributor.mitauthorSamson, Leona D.en_US
dc.contributor.mitauthorVoldman, Joelen_US
dc.relation.journalLab on a Chipen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsVahey, Michael D.; Quiros Pesudo, Laia; Svensson, J. Peter; Samson, Leona D.; Voldman, Joelen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-8898-2296
dc.identifier.orcidhttps://orcid.org/0000-0002-7112-1454
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record