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Electron and Positron Fluxes in Primary Cosmic Rays Measured with the Alpha Magnetic Spectrometer on the International Space Station

dc.contributor.authorBecker, Ulrich J.
dc.contributor.authorBehlmann, Matthew Daniel
dc.contributor.authorBurger, Joseph D.
dc.contributor.authorCai, Xudong
dc.contributor.authorCapell, Michael H.
dc.contributor.authorChen, Andrew I.
dc.contributor.authorChoumilov, Evgueni
dc.contributor.authorChoutko, Vitali
dc.contributor.authorEline, Alexandre
dc.contributor.authorEppling, Frederic J.
dc.contributor.authorFisher, Peter H.
dc.contributor.authorGalaktionov, Y.
dc.contributor.authorGoglov, Pavel
dc.contributor.authorHeil, Melanie
dc.contributor.authorHsieh, Tsai-hsiu
dc.contributor.authorKounina, Olga
dc.contributor.authorKounine, Andrei
dc.contributor.authorKoutsenko, Vladimir
dc.contributor.authorKrafczyk, Matthew Scott
dc.contributor.authorLebedev, Alexei
dc.contributor.authorLi, Q.
dc.contributor.authorPlyaskin, Vasily
dc.contributor.authorRozhkov, Andrey B.
dc.contributor.authorShi, X. Y.
dc.contributor.authorSun, Wei
dc.contributor.authorSun, W. H.
dc.contributor.authorTing, Samuel C. C.
dc.contributor.authorTing, Susan Marks
dc.contributor.authorVaurynovich, Siarhei S.
dc.contributor.authorWang, Xiaozhen
dc.contributor.authorWeng, Zhili
dc.contributor.authorXie, M.
dc.contributor.authorXu, Weiwei
dc.contributor.authorZuccon, Paolo
dc.contributor.authorChen, Hai, Ph. D. Massachusetts Institute of Technology
dc.date.accessioned2014-09-29T14:17:53Z
dc.date.available2014-09-29T14:17:53Z
dc.date.issued2014-09
dc.date.submitted2014-08
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.urihttp://hdl.handle.net/1721.1/90426
dc.description.abstractPrecision measurements by the Alpha Magnetic Spectrometer on the International Space Station of the primary cosmic-ray electron flux in the range 0.5 to 700 GeV and the positron flux in the range 0.5 to 500 GeV are presented. The electron flux and the positron flux each require a description beyond a single power-law spectrum. Both the electron flux and the positron flux change their behavior at ∼30  GeV but the fluxes are significantly different in their magnitude and energy dependence. Between 20 and 200 GeV the positron spectral index is significantly harder than the electron spectral index. The determination of the differing behavior of the spectral indices versus energy is a new observation and provides important information on the origins of cosmic-ray electrons and positrons.en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.113.121102en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleElectron and Positron Fluxes in Primary Cosmic Rays Measured with the Alpha Magnetic Spectrometer on the International Space Stationen_US
dc.typeArticleen_US
dc.identifier.citationAguilar, M., D. Aisa, A. Alvino, G. Ambrosi, K. Andeen, L. Arruda, N. Attig, et al. “Electron and Positron Fluxes in Primary Cosmic Rays Measured with the Alpha Magnetic Spectrometer on the International Space Station.” Physical Review Letters 113, no. 12 (September 2014). © 2014 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Scienceen_US
dc.contributor.mitauthorBecker, Ulrich J.en_US
dc.contributor.mitauthorBehlmann, Matthew Danielen_US
dc.contributor.mitauthorBurger, Joseph D.en_US
dc.contributor.mitauthorCai, Xudongen_US
dc.contributor.mitauthorCapell, Michael H.en_US
dc.contributor.mitauthorChen, Andrew I.en_US
dc.contributor.mitauthorChen, Haien_US
dc.contributor.mitauthorChoumilov, Evguenien_US
dc.contributor.mitauthorChoutko, Vitalien_US
dc.contributor.mitauthorEline, Alexandreen_US
dc.contributor.mitauthorEppling, Frederic J.en_US
dc.contributor.mitauthorFisher, Peter H.en_US
dc.contributor.mitauthorGalaktionov, Y.en_US
dc.contributor.mitauthorGoglov, Pavelen_US
dc.contributor.mitauthorHeil, Melanieen_US
dc.contributor.mitauthorHsieh, Tsai-hsiuen_US
dc.contributor.mitauthorKounina, Olgaen_US
dc.contributor.mitauthorKounine, Andreien_US
dc.contributor.mitauthorKoutsenko, Vladimiren_US
dc.contributor.mitauthorKrafczyk, Matthew Scotten_US
dc.contributor.mitauthorLebedev, Alexeien_US
dc.contributor.mitauthorLi, Q.en_US
dc.contributor.mitauthorPlyaskin, Vasilyen_US
dc.contributor.mitauthorRozhkov, Andrey B.en_US
dc.contributor.mitauthorShi, X. Y.en_US
dc.contributor.mitauthorSun, Weien_US
dc.contributor.mitauthorSun, W. H.en_US
dc.contributor.mitauthorTing, Samuel C. C.en_US
dc.contributor.mitauthorTing, Susan Marksen_US
dc.contributor.mitauthorVaurynovich, Siarhei S.en_US
dc.contributor.mitauthorWang, Xiaozhenen_US
dc.contributor.mitauthorWeng, Zhilien_US
dc.contributor.mitauthorXie, M.en_US
dc.contributor.mitauthorXu, Weiweien_US
dc.contributor.mitauthorZuccon, Paoloen_US
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsAguilar, M.; Aisa, D.; Alvino, A.; Ambrosi, G.; Andeen, K.; Arruda, L.; Attig, N.; Azzarello, P.; Bachlechner, A.; Barao, F.; Barrau, A.; Barrin, L.; Bartoloni, A.; Basara, L.; Battarbee, M.; Battiston, R.; Bazo, J.; Becker, U.; Behlmann, M.; Beischer, B.; Berdugo, J.; Bertucci, B.; Bigongiari, G.; Bindi, V.; Bizzaglia, S.; Bizzarri, M.; Boella, G.; de Boer, W.; Bollweg, K.; Bonnivard, V.; Borgia, B.; Borsini, S.; Boschini, M. J.; Bourquin, M.; Burger, J.; Cadoux, F.; Cai, X. D.; Capell, M.; Caroff, S.; Casaus, J.; Cascioli, V.; Castellini, G.; Cernuda, I.; Cervelli, F.; Chae, M. J.; Chang, Y. H.; Chen, A. I.; Chen, H.; Cheng, G. M.; Chen, H. S.; Cheng, L.; Chikanian, A.; Chou, H. Y.; Choumilov, E.; Choutko, V.; Chung, C. H.; Clark, C.; Clavero, R.; Coignet, G.; Consolandi, C.; Contin, A.; Corti, C.; Coste, B.; Cui, Z.; Dai, M.; Delgado, C.; Della Torre, S.; Demirköz, M. B.; Derome, L.; Di Falco, S.; Di Masso, L.; Dimiccoli, F.; Díaz, C.; von Doetinchem, P.; Du, W. J.; Duranti, M.; D’Urso, D.; Eline, A.; Eppling, F. J.; Eronen, T.; Fan, Y. Y.; Farnesini, L.; Feng, J.; Fiandrini, E.; Fiasson, A.; Finch, E.; Fisher, P.; Galaktionov, Y.; Gallucci, G.; García, B.; García-López, R.; Gast, H.; Gebauer, I.; Gervasi, M.; Ghelfi, A.; Gillard, W.; Giovacchini, F.; Goglov, P.; Gong, J.; Goy, C.; Grabski, V.; Grandi, D.; Graziani, M.; Guandalini, C.; Guerri, I.; Guo, K. H.; Habiby, M.; Haino, S.; Han, K. C.; He, Z. H.; Heil, M.; Hoffman, J.; Hsieh, T. H.; Huang, Z. C.; Huh, C.; Incagli, M.; Ionica, M.; Jang, W. Y.; Jinchi, H.; Kanishev, K.; Kim, G. N.; Kim, K. S.; Kirn, Th.; Kossakowski, R.; Kounina, O.; Kounine, A.; Koutsenko, V.; Krafczyk, M. S.; Kunz, S.; La Vacca, G.; Laudi, E.; Laurenti, G.; Lazzizzera, I.; Lebedev, A.; Lee, H. T.; Lee, S. C.; Leluc, C.; Li, H. L.; Li, J. Q.; Li, Q.; Li, Q.; Li, T. X.; Li, W.; Li, Y.; Li, Z. H.; Li, Z. Y.; Lim, S.; Lin, C. H.; Lipari, P.; Lippert, T.; Liu, D.; Liu, H.; Lomtadze, T.; Lu, M. J.; Lu, Y. S.; Luebelsmeyer, K.; Luo, F.; Luo, J. Z.; Lv, S. S.; Majka, R.; Malinin, A.; Mañá, C.; Marín, J.; Martin, T.; Martínez, G.; Masi, N.; Maurin, D.; Menchaca-Rocha, A.; Meng, Q.; Mo, D. C.; Morescalchi, L.; Mott, P.; Müller, M.; Ni, J. Q.; Nikonov, N.; Nozzoli, F.; Nunes, P.; Obermeier, A.; Oliva, A.; Orcinha, M.; Palmonari, F.; Palomares, C.; Paniccia, M.; Papi, A.; Pedreschi, E.; Pensotti, S.; Pereira, R.; Pilo, F.; Piluso, A.; Pizzolotto, C.; Plyaskin, V.; Pohl, M.; Poireau, V.; Postaci, E.; Putze, A.; Quadrani, L.; Qi, X. M.; Rancoita, P. G.; Rapin, D.; Ricol, J. S.; Rodríguez, I.; Rosier-Lees, S.; Rozhkov, A.; Rozza, D.; Sagdeev, R.; Sandweiss, J.; Saouter, P.; Sbarra, C.; Schael, S.; Schmidt, S. M.; Schuckardt, D.; von Dratzig, A. Schulz; Schwering, G.; Scolieri, G.; Seo, E. S.; Shan, B. S.; Shan, Y. H.; Shi, J. Y.; Shi, X. Y.; Shi, Y. M.; Siedenburg, T.; Son, D.; Spada, F.; Spinella, F.; Sun, W.; Sun, W. H.; Tacconi, M.; Tang, C. P.; Tang, X. W.; Tang, Z. C.; Tao, L.; Tescaro, D.; Ting, Samuel C. C.; Ting, S. M.; Tomassetti, N.; Torsti, J.; Türkoğlu, C.; Urban, T.; Vagelli, V.; Valente, E.; Vannini, C.; Valtonen, E.; Vaurynovich, S.; Vecchi, M.; Velasco, M.; Vialle, J. P.; Wang, L. Q.; Wang, Q. L.; Wang, R. S.; Wang, X.; Wang, Z. X.; Weng, Z. L.; Whitman, K.; Wienkenhöver, J.; Wu, H.; Xia, X.; Xie, M.; Xie, S.; Xiong, R. Q.; Xin, G. M.; Xu, N. S.; Xu, W.; Yan, Q.; Yang, J.; Yang, M.; Ye, Q. H.; Yi, H.; Yu, Y. J.; Yu, Z. Q.; Zeissler, S.; Zhang, J. H.; Zhang, M. T.; Zhang, X. B.; Zhang, Z.; Zheng, Z. M.; Zhuang, H. L.; Zhukov, V.; Zichichi, A.; Zimmermann, N.; Zuccon, P.; Zurbach, C.en_US
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mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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