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dc.contributor.authorHonorio, Jean
dc.contributor.authorJaakkola, Tommi S.
dc.date.accessioned2015-12-18T13:51:02Z
dc.date.available2015-12-18T13:51:02Z
dc.date.issued2013
dc.identifier.issn1532-4435
dc.identifier.issn1533-7928
dc.identifier.urihttp://hdl.handle.net/1721.1/100427
dc.description.abstractWe provide a method that approximates the Bayes error rate and the Shannon entropy with high probability. The Bayes error rate approximation makes possible to build a classifier that polynomially approaches Bayes error rate. The Shannon entropy approximation provides provable performance guarantees for learning trees and Bayesian networks from continuous variables. Our results rely on some reasonable regularity conditions of the unknown probability distributions, and apply to bounded as well as unbounded variables.en_US
dc.language.isoen_US
dc.publisherAssociation for Computing Machinery (ACM)en_US
dc.relation.isversionofhttp://jmlr.org/proceedings/papers/v28/honorio13.htmlen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleTwo-sided exponential concentration bounds for Bayes error rate and Shannon entropyen_US
dc.typeArticleen_US
dc.identifier.citationHonorio, Jean, and Tommi Jaakkola. "Two-sided exponential concentration bounds for Bayes error rate and Shannon entropy." Journal of Machine Learning Research W&CP 28(3): 459–467 (2013).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorHonorio, Jeanen_US
dc.contributor.mitauthorJaakkola, Tommi S.en_US
dc.relation.journalJournal of Machine Learning Researchen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsHonorio, Jean; Jaakkola, Tommien_US
dc.identifier.orcidhttps://orcid.org/0000-0003-0238-6384
dc.identifier.orcidhttps://orcid.org/0000-0002-2199-0379
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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