dc.contributor.author | Ding, Hepeng | |
dc.contributor.author | Demkowicz, Michael J. | |
dc.date.accessioned | 2015-12-28T14:44:05Z | |
dc.date.available | 2015-12-28T14:44:05Z | |
dc.date.issued | 2015-08 | |
dc.date.submitted | 2015-05 | |
dc.identifier.issn | 2045-2322 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/100532 | |
dc.description.abstract | Amorphous silicon oxycarbide (SiOC) is of great technological interest. However, its atomic-level structure is not well understood. Using density functional theory calculations, we show that the clustering tendency of C atoms in SiOC is extremely sensitive to hydrogen (H): without H, the C-C interaction is attractive, leading to enrichment of aggregated SiC[subscript 4] tetrahedral units; with hydrogen, the C-C interaction is repulsive, leading to enrichment of randomly distributed SiCO[subscript 3] tetrahedral units. Our results suggest that conflicting experimental characterizations of C distributions may be due to differing amounts of H present in the samples investigated. Our work also opens a path for tailoring the properties of SiOC by using the total H content to control the C distribution. | en_US |
dc.description.sponsorship | United States. Dept. of Energy. Office of Nuclear Energy (Nuclear Energy Enabling Technologies, Reactor Materials Program Contract DE-NE0000533) | en_US |
dc.language.iso | en_US | |
dc.publisher | Nature Publishing Group | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1038/srep13051 | en_US |
dc.rights | Creative Commons Attribution | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | en_US |
dc.source | Nature Publishing Group | en_US |
dc.title | Hydrogen reverses the clustering tendency of carbon in amorphous silicon oxycarbide | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Ding, Hepeng, and Michael J. Demkowicz. “Hydrogen Reverses the Clustering Tendency of Carbon in Amorphous Silicon Oxycarbide.” Scientific Reports 5 (August 13, 2015): 13051. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.mitauthor | Ding, Hepeng | en_US |
dc.contributor.mitauthor | Demkowicz, Michael J. | en_US |
dc.relation.journal | Scientific Reports | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Ding, Hepeng; Demkowicz, Michael J. | en_US |
dc.identifier.orcid | https://orcid.org/0000-0002-6832-1068 | |
dc.identifier.orcid | https://orcid.org/0000-0003-3949-0441 | |
mit.license | PUBLISHER_CC | en_US |
mit.metadata.status | Complete | |