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dc.contributor.authorLing, Xi
dc.contributor.authorLiang, Liangbo
dc.contributor.authorHuang, Shengxi
dc.contributor.authorPuretzky, Alexander A.
dc.contributor.authorGeohegan, David B.
dc.contributor.authorSumpter, Bobby G.
dc.contributor.authorKong, Jing
dc.contributor.authorMeunier, Vincent
dc.contributor.authorDresselhaus, Mildred
dc.date.accessioned2016-01-10T19:44:59Z
dc.date.available2016-01-10T19:44:59Z
dc.date.issued2015-05
dc.identifier.issn1530-6984
dc.identifier.issn1530-6992
dc.identifier.urihttp://hdl.handle.net/1721.1/100776
dc.description.abstractAs a new two-dimensional layered material, black phosphorus (BP) is a very promising material for nanoelectronics and optoelectronics. We use Raman spectroscopy and first-principles theory to characterize and understand the low-frequency (LF) interlayer breathing modes (<100 cm[superscript –1]) in few-layer BP for the first time. Using a laser polarization dependence study and group theory analysis, the breathing modes are assigned to A[subscript g] symmetry. Compared to the high-frequency (HF) Raman modes, the LF breathing modes are considerably more sensitive to interlayer coupling and, thus, their frequencies show a stronger dependence on the number of layers. Hence, they constitute an effective means to probe both the crystalline orientation and thickness of few-layer BP. Furthermore, the temperature dependence shows that in the temperature range −150 to 30 °C, the breathing modes have a weak anharmonic behavior, in contrast to the HF Raman modes that exhibit strong anharmonicity.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (DMR-1004147)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (DE-SC0001299)en_US
dc.language.isoen_US
dc.publisherAmerican Chemical Society (ACS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/acs.nanolett.5b01117en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceACSen_US
dc.titleObservation of Low-Frequency Interlayer Breathing Modes in Few-Layer Black Phosphorusen_US
dc.title.alternativeLow-Frequency Interlayer Breathing Modes in Few-Layer Black Phosphorusen_US
dc.typeArticleen_US
dc.identifier.citationLing, Xi, Liangbo Liang, Shengxi Huang, Alexander A. Puretzky, David B. Geohegan, Bobby G. Sumpter, Jing Kong, Vincent Meunier, and Mildred S. Dresselhaus. “Low-Frequency Interlayer Breathing Modes in Few-Layer Black Phosphorus.” Nano Lett. 15, no. 6 (June 10, 2015): 4080–4088.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorLing, Xien_US
dc.contributor.mitauthorHuang, Shengxien_US
dc.contributor.mitauthorKong, Jingen_US
dc.contributor.mitauthorDresselhaus, Mildreden_US
dc.relation.journalNano Lettersen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLing, Xi; Liang, Liangbo; Huang, Shengxi; Puretzky, Alexander A.; Geohegan, David B.; Sumpter, Bobby G.; Kong, Jing; Meunier, Vincent; Dresselhaus, Mildred S.en_US
dc.identifier.orcidhttps://orcid.org/0000-0001-8492-2261
dc.identifier.orcidhttps://orcid.org/0000-0002-1955-3081
dc.identifier.orcidhttps://orcid.org/0000-0002-3618-9074
dc.identifier.orcidhttps://orcid.org/0000-0003-0551-1208
mit.licensePUBLISHER_POLICYen_US


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