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dc.contributor.authorSato, K.
dc.contributor.authorSaito, R.
dc.contributor.authorAraujo, P. T.
dc.contributor.authorMafra, Daniela Lopes
dc.contributor.authorKong, Jing
dc.contributor.authorDresselhaus, Mildred
dc.date.accessioned2016-01-11T01:53:29Z
dc.date.available2016-01-11T01:53:29Z
dc.date.issued2012-11
dc.date.submitted2012-10
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1721.1/100793
dc.description.abstractGate-modulated and laser-dependent Raman spectroscopy have been widely used to study q = 0 zone center phonon modes, their self-energy, and their coupling to electrons in graphene systems. In this work we use gate-modulated Raman of q ≠ 0 phonons as a technique to understand the nature of five second-order Raman combination modes observed in the frequency range of 1700–2300 cm[superscript −1] of single-layer graphene (SLG). Anomalous phonon self-energy renormalization phenomena are observed in all five combination modes within this intermediate frequency region, which can clearly be distinguished from one another. By combining the anomalous phonon renormalization effect with the double resonance Raman theory, which includes both phonon dispersion relations and angular dependence of the electron-phonon scattering matrix elements, and by comparing it to the experimentally obtained phonon dispersion, measured by using different laser excitation energies, we can assign each Raman peak to the proper phonon combination mode. This approach should also shed light on the understanding of more complex structures such as few-layer graphene (FLG) and its stacking orders as well as other two-dimensional (2D)-like materials.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (DMR 10-04147)en_US
dc.description.sponsorshipConselho Nacional de Pesquisas (Brazil) (SM Projeto LTDA)en_US
dc.description.sponsorshipConselho Nacional de Pesquisas (Brazil)en_US
dc.description.sponsorshipUnited States. Office of Naval Research. Multidisciplinary University Research Initiative (N00014-09-1-1063)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.86.195434en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleUsing gate-modulated Raman scattering and electron-phonon interactions to probe single-layer graphene: A different approach to assign phonon combination modesen_US
dc.typeArticleen_US
dc.identifier.citationMafra, D. L., J. Kong, K. Sato, R. Saito, M. S. Dresselhaus, and P. T. Araujo. “Using Gate-Modulated Raman Scattering and Electron-Phonon Interactions to Probe Single-Layer Graphene: A Different Approach to Assign Phonon Combination Modes.” Physical Review B 86, no. 19 (November 30, 2012). © 2012 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorMafra, Daniela Lopesen_US
dc.contributor.mitauthorKong, Jingen_US
dc.contributor.mitauthorDresselhaus, Mildreden_US
dc.contributor.mitauthorAraujo, P. T.en_US
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsMafra, D. L.; Kong, J.; Sato, K.; Saito, R.; Dresselhaus, M. S.; Araujo, P. T.en_US
dc.identifier.orcidhttps://orcid.org/0000-0001-8492-2261
dc.identifier.orcidhttps://orcid.org/0000-0003-0551-1208
dc.identifier.orcidhttps://orcid.org/0000-0003-2015-611X
mit.licensePUBLISHER_POLICYen_US


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