Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-ray Photoelectron Spectroscopy Depth Profiling
Author(s)Gilbert, Jonathan B.; Luo, Ming; Shelton, Cameron K.; Rubner, Michael F.; Cohen, Robert E.; Epps, Thomas H.; ... Show more Show less
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X-ray photoelectron spectroscopy (XPS) depth profiling with C[+ over 60] sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene–poly(oligo(oxyethylene)methacrylate) (PS–POEM) copolymer. XPS depth profiling results showed that the lithium-ion concentration was directly correlated with the POEM concentration. Furthermore, chemical state and atomic composition of the film were analyzed through the deconvolution of the C1s signal, indicating that the lithium ions appear to be uniformly distributed in the POEM domains. Overall, the unique capabilities of C[+ over 60] depth profiling XPS provide a powerful tool for the analysis of nanostructured polymer thin films in applications ranging from energy storage and generation to surface coatings and nanoscale templates.
DepartmentMassachusetts Institute of Technology. Center for Materials Science and Engineering; Massachusetts Institute of Technology. Department of Chemical Engineering; Massachusetts Institute of Technology. Department of Materials Science and Engineering
American Chemical Society (ACS)
Gilbert, Jonathan B., Ming Luo, Cameron K. Shelton, Michael F. Rubner, Robert E. Cohen, and Thomas H. Epps. “Determination of Lithium-Ion Distributions in Nanostructured Block Polymer Electrolyte Thin Films by X-Ray Photoelectron Spectroscopy Depth Profiling.” ACS Nano 9, no. 1 (January 27, 2015): 512–20. © 2014 American Chemical Society
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