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dc.contributor.authorZhang, Jinshuo
dc.contributor.authorHo, Pin
dc.contributor.authorBaldo, Marc A.
dc.contributor.authorRoss, Caroline A.
dc.contributor.authorCurrivan-Incorvia, Jean A.
dc.contributor.authorSiddiqui, Saima Afroz
dc.date.accessioned2016-04-06T19:35:21Z
dc.date.available2016-04-06T19:35:21Z
dc.date.issued2015-11
dc.date.submitted2015-08
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/102187
dc.description.abstractThickness modulation at the edges of nanostructured magnetic thin films is shown to have important effects on their perpendicular magnetic anisotropy. Thin film wires with tapered edges were made from [Co/Pd][subscript 20] multilayers or L1[subscript 0]-FePt films using liftoff with a double-layer resist. The effect of edge taper on the reversal process was studied using magnetic force microscopy and micromagnetic modeling. In [Co/Pd][subscript 20], the anisotropy was lower in the tapered edge regions which switched at a lower reverse field compared to the center of the wire. The L1[subscript 0]-FePt wires showed opposite behavior with the tapered regions exhibiting higher anisotropy.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Award ECCS1101798)en_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.4935104en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleEdge-modulated perpendicular magnetic anisotropy in [Co/Pd][subscript n] and L1[subscript 0]-FePt thin film wiresen_US
dc.typeArticleen_US
dc.identifier.citationZhang, Jinshuo, Pin Ho, Jean Anne Currivan-Incorvia, Saima A. Siddiqui, Marc A. Baldo, and Caroline A. Ross. “Edge-Modulated Perpendicular Magnetic Anisotropy in [Co/Pd][subscript n] and L1[subscript 0]-FePt Thin Film Wires.” Applied Physics Letters 107, no. 18 (November 2, 2015): 182408.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.mitauthorZhang, Jinshuoen_US
dc.contributor.mitauthorHo, Pinen_US
dc.contributor.mitauthorCurrivan-Incorvia, Jean A.en_US
dc.contributor.mitauthorSiddiqui, Saima Afrozen_US
dc.contributor.mitauthorBaldo, Marc A.en_US
dc.contributor.mitauthorRoss, Caroline A.en_US
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsZhang, Jinshuo; Ho, Pin; Currivan-Incorvia, Jean Anne; Siddiqui, Saima A.; Baldo, Marc A.; Ross, Caroline A.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-2399-0823
dc.identifier.orcidhttps://orcid.org/0000-0003-2262-1249
dc.identifier.orcidhttps://orcid.org/0000-0002-9884-0598
dc.identifier.orcidhttps://orcid.org/0000-0002-2208-5872
dc.identifier.orcidhttps://orcid.org/0000-0003-2201-5257
mit.licenseOPEN_ACCESS_POLICYen_US


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