Crystallographic analysis of the solid-state dewetting of polycrystalline gold film using automated indexing in a transmission electron microscope
Author(s)Jang, S. A.; Lee, H. J.; Oh, Y. J.; Thompson, Carl V.; Ross, Caroline A.
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We analyzed the effect of crystallographic anisotropy on the morphological evolution of a 12-nm-thick goldfilm during solid-state dewetting at high temperatures using automated indexing tool in a transmission electron microscopy. Dewetting initiated at grain-boundary triple junctions adjacent to large grains resulting from abnormal grain growth driven by (111) texture development. Voids at the junctions developed shapes with faceted edges bounded by low-index crystal planes. The kinetic mobility of the edges varied with the crystal orientation normal to the edges, with a predominance of specific edges with the slowest retraction rates as the annealing time was increased.
DepartmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
American Institute of Physics (AIP)
Jang, S. A., H. J. Lee, C. V. Thompson, C. A. Ross, and Y. J. Oh. “Crystallographic Analysis of the Solid-State Dewetting of Polycrystalline Gold Film Using Automated Indexing in a Transmission Electron Microscope.” APL Materials 3, no. 12 (December 1, 2015): 126103.
Final published version