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Crystallographic analysis of the solid-state dewetting of polycrystalline gold film using automated indexing in a transmission electron microscope

Author(s)
Jang, S. A.; Lee, H. J.; Oh, Y. J.; Thompson, Carl V.; Ross, Caroline A.
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Abstract
We analyzed the effect of crystallographic anisotropy on the morphological evolution of a 12-nm-thick goldfilm during solid-state dewetting at high temperatures using automated indexing tool in a transmission electron microscopy. Dewetting initiated at grain-boundary triple junctions adjacent to large grains resulting from abnormal grain growth driven by (111) texture development. Voids at the junctions developed shapes with faceted edges bounded by low-index crystal planes. The kinetic mobility of the edges varied with the crystal orientation normal to the edges, with a predominance of specific edges with the slowest retraction rates as the annealing time was increased.
Date issued
2015-12
URI
http://hdl.handle.net/1721.1/102189
Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Journal
APL Materials
Publisher
American Institute of Physics (AIP)
Citation
Jang, S. A., H. J. Lee, C. V. Thompson, C. A. Ross, and Y. J. Oh. “Crystallographic Analysis of the Solid-State Dewetting of Polycrystalline Gold Film Using Automated Indexing in a Transmission Electron Microscope.” APL Materials 3, no. 12 (December 1, 2015): 126103.
Version: Final published version
ISSN
2166-532X

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