Fabrication Process Yielding Saturated Nanowire Single-Photon Detectors With 24-Picosecond Jitter
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Alternative title
Fabrication Process Yielding Saturated Nanowire Single-Photon Detectors With 24-ps Jitter
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We present an optimized fabrication process for superconducting nanowire single-photon detectors that allowed us to obtain a yield of ~70% for detectors based on 80-nm-wide niobium nitride nanowires. We fabricated detectors that showed 24-ps timing jitter and saturated detection efficiency without the need for cryogenic amplifiers, allowing for operation in a low-bias low-dark-count-rate regime while operating at maximum detection efficiency.
Date issued
2015-03Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Massachusetts Institute of Technology. Research Laboratory of ElectronicsJournal
IEEE Journal of Selected Topics in Quantum Electronics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Najafi, Faraz, Andrew Dane, Francesco Bellei, Qingyuan Zhao, Kristen A. Sunter, Adam N. McCaughan, and Karl K. Berggren. “Fabrication Process Yielding Saturated Nanowire Single-Photon Detectors With 24-Ps Jitter.” IEEE Journal of Selected Topics in Quantum Electronics 21, no. 2 (March 2015): 1–7.
Version: Author's final manuscript
ISSN
1077-260X
1558-4542