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dc.contributor.authorChen, Fei
dc.contributor.authorTillberg, Paul W.
dc.contributor.authorBoyden, Edward
dc.date.accessioned2016-07-08T17:24:37Z
dc.date.available2016-07-08T17:24:37Z
dc.date.issued2015-01
dc.identifier.issn0036-8075
dc.identifier.issn1095-9203
dc.identifier.urihttp://hdl.handle.net/1721.1/103552
dc.descriptionAvailable in PMC 2015 July 30.en_US
dc.description.abstractIn optical microscopy, fine structural details are resolved by using refraction to magnify images of a specimen. We discovered that by synthesizing a swellable polymer network within a specimen, it can be physically expanded, resulting in physical magnification. By covalently anchoring specific labels located within the specimen directly to the polymer network, labels spaced closer than the optical diffraction limit can be isotropically separated and optically resolved, a process we call expansion microscopy (ExM). Thus, this process can be used to perform scalable superresolution microscopy with diffraction-limited microscopes. We demonstrate ExM with apparent ~70-nanometer lateral resolution in both cultured cells and brain tissue, performing three-color superresolution imaging of ~107 cubic micrometers of the mouse hippocampus with a conventional confocal microscope.en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (NIH Director’s Pioneer Award 1DP1NS087724)en_US
dc.description.sponsorshipNational Institutes of Health (U.S.) (NIH Transformative Research Award 1R01MH103910-01)en_US
dc.description.sponsorshipNew York Stem Cell Foundation (Robertson Investigator Award)en_US
dc.description.sponsorshipNational Science Foundation (U.S.). Center for Brains, Minds and Machines (CBMM) (NSF CCF-1231216)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (NSF CAREER Award CBET 1053233)en_US
dc.language.isoen_US
dc.publisherAmerican Association for the Advancement of Science (AAAS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1126/science.1260088en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourcePMCen_US
dc.titleExpansion microscopyen_US
dc.typeArticleen_US
dc.identifier.citationChen, Fei, Paul W. Tillberg, and Edward S. Boyden. “Expansion Microscopy.” Science 347, no. 6221 (January 15, 2015): 543–548.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Biological Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Brain and Cognitive Sciencesen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Media Laboratoryen_US
dc.contributor.departmentMcGovern Institute for Brain Research at MITen_US
dc.contributor.departmentMassachusetts Institute of Technology. Center for Neurobiological Engineeringen_US
dc.contributor.mitauthorChen, Feien_US
dc.contributor.mitauthorTillberg, Paul W.en_US
dc.contributor.mitauthorBoyden, Edward Stuarten_US
dc.relation.journalScienceen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsChen, F.; Tillberg, P. W.; Boyden, E. S.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-0254-4741
dc.identifier.orcidhttps://orcid.org/0000-0002-0419-3351
mit.licensePUBLISHER_CCen_US


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