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dc.contributor.authorWang, Liangliang
dc.contributor.authorLi, Ruifeng
dc.contributor.authorFang, Yajun
dc.date.accessioned2016-08-11T19:22:39Z
dc.date.available2016-08-11T19:22:39Z
dc.date.issued2016-04
dc.date.submitted2015-12
dc.identifier.issn0091-3286
dc.identifier.urihttp://hdl.handle.net/1721.1/103903
dc.description.abstractWe propose a correspondence approximation approach between temporally adjacent frames for motion analysis. First, energy map is established to represent image spatial features on multiple scales using Gaussian convolution. On this basis, energy flow at each layer is estimated using Gauss–Seidel iteration according to the energy invariance constraint. More specifically, at the core of energy invariance constraint is “energy conservation law” assuming that the spatial energy distribution of an image does not change significantly with time. Finally, energy flow field at different layers is reconstructed by considering different smoothness degrees. Due to the multiresolution origin and energy-based implementation, our algorithm is able to quickly address correspondence searching issues in spite of background noise or illumination variation. We apply our correspondence approximation method to motion analysis, and experimental results demonstrate its applicability.en_US
dc.description.sponsorshipNational Natural Science Foundation (China) (Grant No. 661273339)en_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/1.oe.55.4.043109en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleEnergy flow: image correspondence approximation for motion analysisen_US
dc.typeArticleen_US
dc.identifier.citationWang, Liangliang, Ruifeng Li, and Yajun Fang. "Energy flow: image correspondence approximation for motion analysis." Optical Engineering 55:4 (April 2016), 043109-1.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratoriesen_US
dc.contributor.mitauthorFang, Yajunen_US
dc.relation.journalOptical Engineeringen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsWang, Liangliang; Li, Ruifeng; Fang, Yajunen_US
dspace.embargo.termsNen_US
mit.licensePUBLISHER_POLICYen_US


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