dc.contributor.author | Hoiem, Derek | |
dc.contributor.author | Hays, James | |
dc.contributor.author | Xiao, Jianxiong | |
dc.contributor.author | Khosla, Aditya | |
dc.date.accessioned | 2016-09-30T21:59:56Z | |
dc.date.available | 2016-09-30T21:59:56Z | |
dc.date.issued | 2015-03 | |
dc.identifier.issn | 0920-5691 | |
dc.identifier.issn | 1573-1405 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/104633 | |
dc.description.abstract | Scene understanding is the ability to visually analyze a scene to answer questions such as: What is happening? Why is it happening? What will happen next? What should I do? For example, in the context of driving safety, the vision system would need to recognize nearby people and vehicles, anticipate their motions, infer traffic patterns, and detect road conditions. So far, research has focused on providing complete (e.g., every pixel labeled) or holistic (reasoning about several different scene elements) interpretations, often taking into account scene geometry or 3D spatial relationships. | en_US |
dc.publisher | Springer US | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1007/s11263-015-0807-z | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | Springer US | en_US |
dc.title | Guest Editorial: Scene Understanding | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Hoiem, Derek et al. “Guest Editorial: Scene Understanding.” International Journal of Computer Vision 112.2 (2015): 131–132. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.mitauthor | Khosla, Aditya | |
dc.relation.journal | International Journal of Computer Vision | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dc.date.updated | 2016-05-23T12:14:40Z | |
dc.language.rfc3066 | en | |
dc.rights.holder | Springer Science+Business Media New York | |
dspace.orderedauthors | Hoiem, Derek; Hays, James; Xiao, Jianxiong; Khosla, Aditya | en_US |
dspace.embargo.terms | N | en |
dc.identifier.orcid | https://orcid.org/0000-0002-0007-3352 | |
mit.license | PUBLISHER_POLICY | en_US |