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dc.contributor.authorWalters, Christopher
dc.contributor.authorAngrist, Joshua
dc.contributor.authorHull, Peter Davenport
dc.contributor.authorPathak, Parag
dc.date.accessioned2016-10-24T19:05:33Z
dc.date.available2016-10-24T19:05:33Z
dc.date.issued2016-05
dc.identifier.issn0002-8282
dc.identifier.issn1944-7981
dc.identifier.urihttp://hdl.handle.net/1721.1/104953
dc.description.abstractWe develop over-identification tests that use admissions lotteries to assess the predictive value of regression-based value-added models (VAMs). These tests have degrees of freedom equal to the number of quasi-experiments available to estimate school effects. By contrast, previously implemented VAM validation strategies look at a single restriction only, sometimes said to measure forecast bias. Tests of forecast bias may be misleading when the test statistic is constructed from many lotteries or quasi-experiments, some of which have weak first stage effects on school attendance. The theory developed here is applied to data from the Charlotte-Mecklenberg School district analyzed by Deming (2014).en_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.description.sponsorshipLaura and John Arnold Foundationen_US
dc.description.sponsorshipSpencer Foundationen_US
dc.language.isoen_US
dc.publisherAmerican Economic Association (AEA)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1257/aer.p20161080en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Economic Associationen_US
dc.titleInterpreting Tests of School VAM Validityen_US
dc.typeArticleen_US
dc.identifier.citationAngrist, Joshua, Peter Hull, Parag Pathak, and Christopher Walters. “Interpreting Tests of School VAM Validity.” American Economic Review 106, no. 5 (May 2016): 388–392. ©2016 American Economic Association.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Economicsen_US
dc.contributor.mitauthorAngrist, Joshua
dc.contributor.mitauthorHull, Peter Davenport
dc.contributor.mitauthorPathak, Parag
dc.relation.journalAmerican Economic Reviewen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsAngrist, Joshua; Hull, Peter; Pathak, Parag; Walters, Christopheren_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-6992-8956
dc.identifier.orcidhttps://orcid.org/0000-0003-3910-1573
dc.identifier.orcidhttps://orcid.org/0000-0001-8621-3864
mit.licensePUBLISHER_POLICYen_US


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