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dc.contributor.authorFei, Ruixiang
dc.contributor.authorLi, Wenbin
dc.contributor.authorLi, Ju
dc.contributor.authorYang, Li
dc.date.accessioned2016-11-03T20:49:32Z
dc.date.available2016-11-03T20:49:32Z
dc.date.issued2015-10
dc.date.submitted2015-07
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/105190
dc.description.abstractWe predict enormous, anisotropic piezoelectric effects in intrinsic monolayer group IV monochalcogenides (MX, M=Sn or Ge, X=Se or S), including SnSe, SnS, GeSe, and GeS. Using first-principle simulations based on the modern theory of polarization, we find that their piezoelectric coefficients are about one to two orders of magnitude larger than those of other 2D materials, such as MoS[subscript 2] and GaSe, and bulk quartz and AlN which are widely used in industry. This enhancement is a result of the unique “puckered” C[subscript 2v] symmetry and electronic structure of monolayer group IV monochalcogenides. Given the achieved experimental advances in the fabrication of monolayers, their flexible character, and ability to withstand enormous strain, these 2D structures with giant piezoelectric effects may be promising for a broad range of applications such as nano-sized sensors, piezotronics, and energy harvesting in portable electronic devices.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant DMR-1410636 and DMR-1120901)en_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.4934750en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleGiant piezoelectricity of monolayer group IV monochalcogenides: SnSe, SnS, GeSe, and GeSen_US
dc.typeArticleen_US
dc.identifier.citationFei, Ruixiang et al. “Giant Piezoelectricity of Monolayer Group IV Monochalcogenides: SnSe, SnS, GeSe, and GeS.” Applied Physics Letters 107.17 (2015): 173104. © 2015 AIP Publishing LLCen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Nuclear Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorLi, Wenbin
dc.contributor.mitauthorLi, Ju
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsFei, Ruixiang; Li, Wenbin; Li, Ju; Yang, Lien_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-7841-8058
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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