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Detector Fabrication Yield for SuperCDMS Soudan

dc.contributor.authorBrink, P. L
dc.contributor.authorBalakishiyeva, D.
dc.contributor.authorBauer, D. A
dc.contributor.authorBeaty, J.
dc.contributor.authorBrandt, D.
dc.contributor.authorCabrera, B.
dc.contributor.authorChagani, H.
dc.contributor.authorCherry, M.
dc.contributor.authorCooley, J.
dc.contributor.authordo Couto e Silva, E.
dc.contributor.authorCushman, P.
dc.contributor.authorDaal, M.
dc.contributor.authorDoughty, T.
dc.contributor.authorFritts, M.
dc.contributor.authorGodfrey, G.
dc.contributor.authorGolwala, S. R
dc.contributor.authorHall, J.
dc.contributor.authorHarris, R.
dc.contributor.authorHines, B. A
dc.contributor.authorHsu, L.
dc.contributor.authorHuber, M. E
dc.contributor.authorKamaev, O.
dc.contributor.authorKara, B.
dc.contributor.authorKenany, S. A
dc.contributor.authorLeman, S. W
dc.contributor.authorMahapatra, R.
dc.contributor.authorMandic, V.
dc.contributor.authorMirabolfathi, N.
dc.contributor.authorNovak, L.
dc.contributor.authorPartridge, R.
dc.contributor.authorPyle, M.
dc.contributor.authorQiu, H.
dc.contributor.authorRadpour, R.
dc.contributor.authorRau, W.
dc.contributor.authorReisetter, A.
dc.contributor.authorResch, R.
dc.contributor.authorSaab, T.
dc.contributor.authorSadoulet, B.
dc.contributor.authorSander, J.
dc.contributor.authorSchmitt, R.
dc.contributor.authorSchnee, R. W
dc.contributor.authorScorza, S.
dc.contributor.authorSeitz, D. N
dc.contributor.authorSerfass, B.
dc.contributor.authorShank, B.
dc.contributor.authorTomada, A.
dc.contributor.authorVillano, A.
dc.contributor.authorWelliver, B.
dc.contributor.authorYen, J. J
dc.contributor.authorYoung, B. A
dc.contributor.authorZhang, J.
dc.contributor.authorAnderson, Adam Jonathan
dc.contributor.authorFigueroa-Feliciano, Enectali
dc.contributor.authorHertel, Scott A
dc.contributor.authorLeman, Steven W.
dc.contributor.authorMcCarthy, Kevin Ahmad
dc.date.accessioned2016-11-07T20:44:25Z
dc.date.available2016-11-07T20:44:25Z
dc.date.issued2014-02
dc.date.submitted2013-07
dc.identifier.issn0022-2291
dc.identifier.issn1573-7357
dc.identifier.urihttp://hdl.handle.net/1721.1/105236
dc.description.abstractThe SuperCDMS collaboration is presently operating a 9 kg Ge payload at the Soudan Underground Laboratory in their direct search for dark matter. The Ge detectors utilize double-sided athermal phonon sensors with an interdigitated electrode structure (iZIPs) to reject near-surface electron-recoil events. These detectors each have a mass of 0.6 kg and were fabricated with photolithographic techniques. The detector fabrication advances required and the production yield encountered are described.en_US
dc.description.sponsorshipUnited States. Dept. of Energyen_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.publisherSpringer USen_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/s10909-014-1100-1en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSpringer USen_US
dc.titleDetector Fabrication Yield for SuperCDMS Soudanen_US
dc.typeArticleen_US
dc.identifier.citationBrink, P. L. et al. “Detector Fabrication Yield for SuperCDMS Soudan.” Journal of Low Temperature Physics (2014): n. pag.en_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorAnderson, Adam Jonathan
dc.contributor.mitauthorFigueroa-Feliciano, Enectali
dc.contributor.mitauthorHertel, Scott A
dc.contributor.mitauthorLeman, Steven W.
dc.contributor.mitauthorMcCarthy, Kevin Ahmad
dc.relation.journalJournal of Low Temperature Physicsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2016-08-18T15:42:02Z
dc.language.rfc3066en
dc.rights.holderSpringer Science+Business Media New York
dspace.orderedauthorsBrink, P. L.; Anderson, A. J.; Balakishiyeva, D.; Bauer, D. A.; Beaty, J.; Brandt, D.; Cabrera, B.; Chagani, H.; Cherry, M.; Cooley, J.; do Couto e Silva, E.; Cushman, P.; Daal, M.; Doughty, T.; Figueroa-Feliciano, E.; Fritts, M.; Godfrey, G.; Golwala, S. R.; Hall, J.; Harris, R.; Hertel, S.; Hines, B. A.; Hsu, L.; Huber, M. E.; Kamaev, O.; Kara, B.; Kenany, S. A.; Leman, S. W.; Mahapatra, R.; Mandic, V.; McCarthy, K. A.; Mirabolfathi, N.; Novak, L.; Partridge, R.; Pyle, M.; Qiu, H.; Radpour, R.; Rau, W.; Reisetter, A.; Resch, R.; Saab, T.; Sadoulet, B.; Sander, J.; Schmitt, R.; Schnee, R. W.; Scorza, S.; Seitz, D. N.; Serfass, B.; Shank, B.; Tomada, A.; Villano, A.; Welliver, B.; Yen, J. J.; Young, B. A.; Zhang, J.en_US
dspace.embargo.termsNen
dc.identifier.orcidhttps://orcid.org/0000-0002-4435-4623
dc.identifier.orcidhttps://orcid.org/0000-0001-9285-5556
mit.licensePUBLISHER_POLICYen_US


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