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dc.contributor.authorZhang, Jinshuo
dc.contributor.authorSiddiqui, Saima Afroz
dc.contributor.authorHo, Pin
dc.contributor.authorCurrivan, Jean Anne
dc.contributor.authorLage, Enno
dc.contributor.authorBono, David C
dc.contributor.authorBaldo, Marc A
dc.contributor.authorRoss, Caroline A.
dc.date.accessioned2016-11-17T23:53:53Z
dc.date.available2016-11-17T23:53:53Z
dc.date.issued2016-05
dc.date.submitted2016-03
dc.identifier.issn1367-2630
dc.identifier.issn1367-2630
dc.identifier.urihttp://hdl.handle.net/1721.1/105358
dc.description.abstractThe formation of 360° magnetic domain walls (360DWs) in Co and Ni[subscript 80]Fe[subscript 20] thin film wires was demonstrated experimentally for different wire widths, by successively injecting two 180° domain walls (180DWs) into the wire. For narrow wires (≤ 50 nm wide for Co), edge roughness prevented the combination of the 180DWs into a 360DW, and for wide wires (200 nm for Co) the 360DW was unstable and annihilated spontaneously, but over an intermediate range of wire widths, reproducible 360DW formation occurred. The annihilation and dissociation of 360DWs was demonstrated by applying a magnetic field parallel to the wire, showing that annihilation fields were several times higher than dissociation fields in agreement with micromagnetic modeling. The annihilation of a 360DW by current pulsing was demonstrated.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Award ECCS 1101798)en_US
dc.language.isoen_US
dc.publisherIOP Publishingen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/1367-2630/18/5/053028en_US
dc.rightsCreative Commons Attribution 3.0 Unported licenceen_US
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en_US
dc.sourceIOP Publishingen_US
dc.title360° domain walls: stability, magnetic field and electric current effectsen_US
dc.typeArticleen_US
dc.identifier.citationZhang, Jinshuo et al. “360° Domain Walls: Stability, Magnetic Field and Electric Current Effects.” New Journal of Physics 18.5 (2016): 53028. © 2016 IOP Publishing Ltd and Deutsche Physikalische Gesellschaften_US
dc.contributor.departmentMassachusetts Institute of Technology. Center for Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorZhang, Jinshuo
dc.contributor.mitauthorSiddiqui, Saima Afroz
dc.contributor.mitauthorHo, Pin
dc.contributor.mitauthorCurrivan, Jean Anne
dc.contributor.mitauthorLage, Enno
dc.contributor.mitauthorBono, David C
dc.contributor.mitauthorBaldo, Marc A
dc.contributor.mitauthorRoss, Caroline A
dc.relation.journalNew Journal of Physicsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsZhang, Jinshuo; Siddiqui, Saima A; Ho, Pin; Currivan-Incorvia, Jean Anne; Tryputen, Larysa; Lage, Enno; Bono, David C; Baldo, Marc A; Ross, Caroline Aen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-2208-5872
dc.identifier.orcidhttps://orcid.org/0000-0002-9884-0598
dc.identifier.orcidhttps://orcid.org/0000-0002-2399-0823
dc.identifier.orcidhttps://orcid.org/0000-0002-3056-4822
dc.identifier.orcidhttps://orcid.org/0000-0003-2201-5257
dc.identifier.orcidhttps://orcid.org/0000-0003-2262-1249
mit.licensePUBLISHER_CCen_US
mit.metadata.statusComplete


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