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dc.contributor.authorBertsatos, Ioannis
dc.contributor.authorMakris, Nicholas
dc.date.accessioned2016-11-22T18:59:24Z
dc.date.available2016-11-22T18:59:24Z
dc.date.issued2010-03
dc.date.submitted2010-02
dc.identifier.issn00191035
dc.identifier.urihttp://hdl.handle.net/1721.1/105422
dc.description.abstractPhotoclinometry is the most common method used to obtain high-resolution topographic maps of planetary terrain. We derive the likelihood function of photoclinometric surface slope from (1) the probability distribution of the measured photon count of natural sunlight through a Charge-Coupled Device (CCD) including uncertainty due to camera shot noise, camera read noise, small-scale albedo fluctuation and atmospheric haze, and (2) a photometric model relating photocount to surface orientation. We then use classical estimation theory to determine the theoretically exact biases and errors inherent in photoclinometric surface slope and show when they may be approximated by asymptotic expressions for sufficiently high sample size. We show how small-scale albedo variability often dominates biases and errors, which may become an order of magnitude larger than surface slopes when surface reflectance has a weak dependence on surface tilt. We provide bounds on the minimum possible error of any unbiased photoclinometric surface slope estimate, and compute the sample sizes necessary to constrain errors within desired design thresholds.en_US
dc.language.isoen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.icarus.2010.03.019en_US
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivs Licenseen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.sourceProf. Makrisen_US
dc.titleStatistical biases and errors inherent in photoclinometric surface slope estimation with natural lighten_US
dc.typeArticleen_US
dc.identifier.citationBertsatos, Ioannis, and Nicholas C. Makris. “Statistical Biases and Errors Inherent in Photoclinometric Surface Slope Estimation with Natural Light.” Icarus 208, no. 2 (August 2010): 798-810.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.approverMakris, Nicholasen_US
dc.contributor.mitauthorBertsatos, Ioannis
dc.contributor.mitauthorMakris, Nicholas
dc.relation.journalIcarusen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsBertsatos, Ioannis; Makris, Nicholas C.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-4369-296X
mit.licensePUBLISHER_CCen_US


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