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dc.contributor.authorMaser, Jörg
dc.contributor.authorLai, Barry
dc.contributor.authorCai, Zhonghou
dc.contributor.authorChen, Si
dc.contributor.authorFinney, Lydia
dc.contributor.authorGleber, Sophie-Charlotte
dc.contributor.authorJacobsen, Chris
dc.contributor.authorPreissner, Curt
dc.contributor.authorRoehrig, Chris
dc.contributor.authorRose, Volker
dc.contributor.authorShu, Deming
dc.contributor.authorVine, David
dc.contributor.authorVogt, Stefan
dc.contributor.authorBuonassisi, Anthony
dc.date.accessioned2016-12-16T20:54:09Z
dc.date.available2016-12-16T20:54:09Z
dc.date.issued2013-08
dc.date.submitted2013-03
dc.identifier.issn1073-5623
dc.identifier.issn1543-1940
dc.identifier.urihttp://hdl.handle.net/1721.1/105860
dc.description.abstractThe Advanced Photon Source is developing a suite of new X-ray beamlines to study materials and devices across many length scales and under real conditions. One of the flagship beamlines of the APS upgrade is the In Situ Nanoprobe (ISN) beamline, which will provide in situ and operando characterization of advanced energy materials and devices under varying temperatures, gas ambients, and applied fields, at previously unavailable spatial resolution and throughput. Examples of materials systems include inorganic and organic photovoltaic systems, advanced battery systems, fuel cell components, nanoelectronic devices, advanced building materials and other scientifically and technologically relevant systems. To characterize these systems at very high spatial resolution and trace sensitivity, the ISN will use both nanofocusing mirrors and diffractive optics to achieve spots sizes as small as 20 nm. Nanofocusing mirrors in Kirkpatrick–Baez geometry will provide several orders of magnitude increase in photon flux at a spatial resolution of 50 nm. Diffractive optics such as zone plates and/or multilayer Laue lenses will provide a highest spatial resolution of 20 nm. Coherent diffraction methods will be used to study even small specimen features with sub-10 nm relevant length scale. A high-throughput data acquisition system will be employed to significantly increase operations efficiency and usability of the instrument. The ISN will provide full spectroscopy capabilities to study the chemical state of most materials in the periodic table, and enable X-ray fluorescence tomography. Insitu electrical characterization will enable operando studies of energy and electronic devices such as photovoltaic systems and batteries. We describe the optical concept for the ISN beamline, the technical design, and the approach for enabling a broad variety of in situ studies. We furthermore discuss the application of hard X-ray microscopy to study defects in multi-crystalline solar cells, one of the lines of inquiries for which the ISN is being developed.en_US
dc.publisherSpringer USen_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/s11661-013-1901-xen_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceSpringer USen_US
dc.titleA Next-Generation Hard X-Ray Nanoprobe Beamline for In Situ Studies of Energy Materials and Devicesen_US
dc.typeArticleen_US
dc.identifier.citationMaser, Jörg, Barry Lai, Tonio Buonassisi, Zhonghou Cai, Si Chen, Lydia Finney, Sophie-Charlotte Gleber, et al. “A Next-Generation Hard X-Ray Nanoprobe Beamline for In Situ Studies of Energy Materials and Devices.” Metallurgical and Materials Transactions A 45, no. 1 (August 20, 2013): 85–97.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorBuonassisi, Anthony
dc.relation.journalMetallurgical and Materials Transactions Aen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2016-08-18T15:45:34Z
dc.language.rfc3066en
dc.rights.holderThe Minerals, Metals & Materials Society and ASM International
dspace.orderedauthorsMaser, Jörg; Lai, Barry; Buonassisi, Tonio; Cai, Zhonghou; Chen, Si; Finney, Lydia; Gleber, Sophie-Charlotte; Jacobsen, Chris; Preissner, Curt; Roehrig, Chris; Rose, Volker; Shu, Deming; Vine, David; Vogt, Stefanen_US
dspace.embargo.termsNen
dc.identifier.orcidhttps://orcid.org/0000-0001-8345-4937
mit.licenseOPEN_ACCESS_POLICYen_US


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