| dc.contributor.author | Marx, Gary T. | |
| dc.date.accessioned | 2017-02-17T19:27:22Z | |
| dc.date.available | 2017-02-17T19:27:22Z | |
| dc.date.issued | 2016-04 | |
| dc.identifier.issn | 0147-2011 | |
| dc.identifier.issn | 1936-4725 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/106987 | |
| dc.description.abstract | In my book Windows Into the Soul: Surveillance and Society in an Age of High Technology (Marx 2016) I analyze many of the social, political, ethical and cultural issues raised by the new surveillance. The book uses a variety of traditional methods such as observation, interviews, document analysis and quantitative measures to document surveillance behaviors such as video, drones, DNA, drug testing and computer monitoring. | en_US |
| dc.publisher | Springer US | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1007/s12115-016-0017-5 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | Springer US | en_US |
| dc.title | Surveillance and Surveys: the Soft Interview of the Future | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Marx, Gary T. “Surveillance and Surveys: The Soft Interview of the Future.” Society 53, no. 3 (April 4, 2016): 301–306. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Urban Studies and Planning | en_US |
| dc.contributor.mitauthor | Marx, Gary T. | |
| dc.relation.journal | Society | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2016-05-23T12:17:54Z | |
| dc.language.rfc3066 | en | |
| dc.rights.holder | Springer Science+Business Media New York | |
| dspace.orderedauthors | Marx, Gary T. | en_US |
| dspace.embargo.terms | N | en |
| mit.license | PUBLISHER_POLICY | en_US |
