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dc.contributor.authorLiao, Bolin
dc.contributor.authorMaznev, Alexei
dc.contributor.authorNelson, Keith Adam
dc.contributor.authorChen, Gang
dc.date.accessioned2017-04-03T18:38:52Z
dc.date.available2017-04-03T18:38:52Z
dc.date.issued2016-10
dc.date.submitted2016-03
dc.identifier.issn2041-1723
dc.identifier.urihttp://hdl.handle.net/1721.1/107830
dc.description.abstractThere is a growing interest in the mode-by-mode understanding of electron and phonon transport for improving energy conversion technologies, such as thermoelectrics and photovoltaics. Whereas remarkable progress has been made in probing phonon–phonon interactions, it has been a challenge to directly measure electron–phonon interactions at the single-mode level, especially their effect on phonon transport above cryogenic temperatures. Here we use three-pulse photoacoustic spectroscopy to investigate the damping of a single sub-terahertz coherent phonon mode by free charge carriers in silicon at room temperature. Building on conventional pump–probe photoacoustic spectroscopy, we introduce an additional laser pulse to optically generate charge carriers, and carefully design temporal sequence of the three pulses to unambiguously quantify the scattering rate of a single-phonon mode due to the electron–phonon interaction. Our results confirm predictions from first-principles simulations and indicate the importance of the often-neglected effect of electron–phonon interaction on phonon transport in doped semiconductors.en_US
dc.language.isoen_US
dc.publisherNature Publishing Groupen_US
dc.relation.isversionofhttp://dx.doi.org/10.1038/ncomms13174en_US
dc.rightsCreative Commons Attribution 4.0 International Licenseen_US
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en_US
dc.sourceNatureen_US
dc.titlePhoto-excited charge carriers suppress sub-terahertz phonon mode in silicon at room temperatureen_US
dc.typeArticleen_US
dc.identifier.citationLiao, Bolin et al. “Photo-Excited Charge Carriers Suppress Sub-Terahertz Phonon Mode in Silicon at Room Temperature.” Nature Communications 7 (2016): 13174.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorLiao, Bolin
dc.contributor.mitauthorMaznev, Alexei
dc.contributor.mitauthorNelson, Keith Adam
dc.contributor.mitauthorChen, Gang
dc.relation.journalNature Communicationsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLiao, Bolin; Maznev, A. A.; Nelson, Keith A.; Chen, Gangen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-0898-0803
dc.identifier.orcidhttps://orcid.org/0000-0001-7804-5418
dc.identifier.orcidhttps://orcid.org/0000-0002-3968-8530
mit.licensePUBLISHER_CCen_US


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