Show simple item record

dc.contributor.authorZhang, Zheng
dc.contributor.authorKamon, Mattan
dc.contributor.authorDaniel, Luca
dc.date.accessioned2017-04-13T12:03:56Z
dc.date.available2017-04-13T12:03:56Z
dc.date.issued2014-10
dc.identifier.issn1057-7157
dc.identifier.issn1941-0158
dc.identifier.urihttp://hdl.handle.net/1721.1/108090
dc.description.abstractThe voltages at which microelectromechanical actuators and sensors become unstable, known as pull-in and lift-off voltages, are critical parameters in microelectromechanical systems (MEMS) design. The state-of-the-art MEMS simulators compute these parameters by simply sweeping the voltage, leading to either excessively large computational cost or to convergence failure near the pull-in or lift-off points. This paper proposes to simulate the behavior at pull-in and lift-off employing two continuation-based algorithms. The first algorithm appropriately adapts standard continuation methods, providing a complete set of static solutions. The second algorithm uses continuation to trace two kinds of curves and generates the sweep-up or sweep-down curves, which can provide more intuition for MEMS designers. The algorithms presented in this paper are robust and suitable for general-purpose industrial MEMS designs. Our algorithms have been implemented in a commercial MEMS/integrated circuits codesign tool, and their effectiveness is validated by comparisons against measurement data and the commercial finite-element/boundary-element (FEM/BEM) solver CoventorWare.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceProf. Daniel via Phoebe Ayersen_US
dc.titleContinuation-Based Pull-In and Lift-Off Simulation Algorithms for Microelectromechanical Devicesen_US
dc.typeArticleen_US
dc.identifier.citationZhang, Zheng, Mattan Kamon, and Luca Daniel. “Continuation-Based Pull-In and Lift-Off Simulation Algorithms for Microelectromechanical Devices.” J. Microelectromech. Syst. 23, no. 5 (October 2014): 1084–1093. © 2014en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Computation for Design and Optimization Programen_US
dc.contributor.approverDaniel, Lucaen_US
dc.contributor.mitauthorZhang, Zheng
dc.contributor.mitauthorKamon, Mattan
dc.contributor.mitauthorDaniel, Luca
dc.relation.journalJournal of Microelectromechanical Systemsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsZhang, Zheng; Kamon, Mattan; Daniel, Lucaen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-5880-3151
mit.licenseOPEN_ACCESS_POLICYen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record