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dc.contributor.authorMcIver, James W.
dc.contributor.authorLee, Yi-Hsien
dc.contributor.authorSie, Edbert Jarvis
dc.contributor.authorFu, Liang
dc.contributor.authorKong, Jing
dc.contributor.authorGedik, Nuh
dc.date.accessioned2017-04-18T12:51:38Z
dc.date.available2017-04-18T12:51:38Z
dc.date.issued2017-04
dc.identifier.issn0277-786X
dc.identifier.issn1996-756x
dc.identifier.urihttp://hdl.handle.net/1721.1/108202
dc.description.abstractSemiconductors that are atomically thin can exhibit novel optical properties beyond those encountered in the bulk compounds. Monolayer transition-metal dichalcogenides (TMDs) are leading examples of such semiconductors that possess remarkable optical properties. They obey unique selection rules where light with different circular polarization can be used for selective photoexcitation at two different valleys in the momentum space. These valleys constitute bandgaps that are normally locked in the same energy. Selectively varying their energies is of great interest for applications because it unlocks the potential to control valley degree of freedom, and offers a new promising way to carry information in next-generation valleytronics. In this proceeding paper, we show that the energy gaps at the two valleys can be shifted relative to each other by means of the optical Stark effect in a controllable valley-selective manner. We discuss the physics of the optical Stark effect, and we describe the mechanism that leads to its valleyselectivity in monolayer TMD tungsten disulfide (WS[subscript 2]).en_US
dc.description.sponsorshipUnited States. Department of Energy (DE-FG02-08ER46521)en_US
dc.description.sponsorshipUnited States. Department of Energy (DESC0006423)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (DMR-0845358)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (DMR-1231319)en_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.2223462en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleOptical Stark effect in 2D semiconductorsen_US
dc.typeArticleen_US
dc.identifier.citationSie, Edbert J.; McIver, James W.; Lee, Yi-Hsien; Fu, Liang; Kong, Jing and Gedik, Nuh. “Optical Stark Effect in 2D Semiconductors.” Edited by Michael K. Rafailov and Eric Mazur. Ultrafast Bandgap Photonics (May 13, 2016). © 2016 SPIEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorSie, Edbert Jarvis
dc.contributor.mitauthorFu, Liang
dc.contributor.mitauthorKong, Jing
dc.contributor.mitauthorGedik, Nuh
dc.relation.journalProceedings of SPIE--the Society of Photo-Optical Instrumentation Engineersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsSie, Edbert J.; McIver, James W.; Lee, Yi-Hsien; Fu, Liang; Kong, Jing; Gedik, Nuhen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-3477-6459
dc.identifier.orcidhttps://orcid.org/0000-0002-8803-1017
dc.identifier.orcidhttps://orcid.org/0000-0003-0551-1208
dc.identifier.orcidhttps://orcid.org/0000-0002-6394-4987
mit.licensePUBLISHER_POLICYen_US


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