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dc.contributor.authorMaffezzoni, Paolo
dc.contributor.authorElfadel, Ibrahim M.
dc.contributor.authorZhang, Zheng
dc.contributor.authorEl Moselhy, Tarek Ali
dc.contributor.authorDaniel, Luca
dc.date.accessioned2017-04-19T19:04:09Z
dc.date.available2017-04-19T19:04:09Z
dc.date.issued2013-09
dc.identifier.issn1549-7747
dc.identifier.issn1558-3791
dc.identifier.urihttp://hdl.handle.net/1721.1/108267
dc.description.abstractThis brief proposes an uncertainty quantification method for the periodic steady-state (PSS) analysis with both Gaussian and non-Gaussian variations. Our stochastic testing formulation for the PSS problem provides superior efficiency over both Monte Carlo methods and existing spectral methods. The numerical implementation of a stochastic shooting Newton solver is presented for both forced and autonomous circuits. Simulation results on some analog/RF circuits are reported to show the effectiveness of our proposed algorithms.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TCSII.2013.2278110en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceProf. Daniel via Phoebe Ayersen_US
dc.titleEfficient Uncertainty Quantification for the Periodic Steady State of Forced and Autonomous Circuitsen_US
dc.title.alternativeEfficient Uncertainty Quantification for the Periodic Steady State of Forced and Autonomous Circuitsen_US
dc.typeArticleen_US
dc.identifier.citationZhang, Zheng; El-Moselhy, Tarek A.; Maffezzoni, Paolo; Elfadel, Ibrahim M. and Daniel, Luca. “Efficient Uncertainty Quantification for the Periodic Steady State of Forced and Autonomous Circuits.” IEEE Trans. Circuits Syst. II 60, no. 10 (October 2013): 687–691. © 2013 Institute of Electrical and Electronics Engineers (IEEE)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverDaniel, Lucaen_US
dc.contributor.mitauthorZhang, Zheng
dc.contributor.mitauthorEl Moselhy, Tarek Ali
dc.contributor.mitauthorDaniel, Luca
dc.relation.journalIEEE Transactions on Circuits and Systems II: Express Briefsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsZhang, Zheng; El-Moselhy, Tarek A.; Maffezzoni, Paolo; Elfadel, Ibrahim M.; Daniel, Lucaen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-5880-3151
mit.licenseOPEN_ACCESS_POLICYen_US


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