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dc.contributor.authorHsu, C. W.
dc.contributor.authorRegan, Emma
dc.contributor.authorIgarashi, Yuichi
dc.contributor.authorZhen, Bo
dc.contributor.authorKaminer, Ido Efraim
dc.contributor.authorShen, Yichen
dc.contributor.authorJoannopoulos, John
dc.contributor.authorSoljacic, Marin
dc.date.accessioned2017-04-21T13:55:33Z
dc.date.available2017-04-21T13:55:33Z
dc.date.issued2016-11
dc.date.submitted2016-07
dc.identifier.issn2375-2548
dc.identifier.urihttp://hdl.handle.net/1721.1/108336
dc.description.abstractThe isofrequency contours of a photonic crystal are important for predicting and understanding exotic optical phenomena that are not apparent from high-symmetry band structure visualizations. We demonstrate a method to directly visualize the isofrequency contours of high-quality photonic crystal slabs that show quantitatively good agreement with numerical results throughout the visible spectrum. Our technique relies on resonance-enhanced photon scattering from generic fabrication disorder and surface roughness, so it can be applied to general photonic and plasmonic crystals or even quasi-crystals. We also present an analytical model of the scattering process, which explains the observation of isofrequency contours in our technique. Furthermore, the isofrequency contours provide information about the characteristics of the disorder and therefore serve as a feedback tool to improve fabrication processes.en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Institute for Soldier Nanotechnologies (W911NF-13-D-0001)en_US
dc.description.sponsorshipSolid-State Solar-Thermal Energy Conversion Center (DE-SC0001299)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (DMR-1307632)en_US
dc.language.isoen_US
dc.publisherAmerican Association for the Advancement of Science (AAAS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1126/sciadv.1601591en_US
dc.rightsCreative Commons Attribution-NonCommercial 4.0 Internationalen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc/4.0/en_US
dc.sourceAAASen_US
dc.titleDirect imaging of isofrequency contours in photonic structuresen_US
dc.typeArticleen_US
dc.identifier.citationRegan, E. C.; Igarashi, Y.; Zhen, B.; Kaminer, I.; Hsu, C. W.; Shen, Y.; Joannopoulos, J. D. and Soljacic, M. “Direct Imaging of Isofrequency Contours in Photonic Structures.” Science Advances 2, no. 11 (November 25, 2016): e1601591–e1601591. © 2016 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science (AAAS)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorRegan, Emma
dc.contributor.mitauthorIgarashi, Yuichi
dc.contributor.mitauthorZhen, Bo
dc.contributor.mitauthorKaminer, Ido Efraim
dc.contributor.mitauthorShen, Yichen
dc.contributor.mitauthorJoannopoulos, John
dc.contributor.mitauthorSoljacic, Marin
dc.relation.journalScience Advancesen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsRegan, E. C.; Igarashi, Y.; Zhen, B.; Kaminer, I.; Hsu, C. W.; Shen, Y.; Joannopoulos, J. D.; Soljacic, M.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-7572-4594
dc.identifier.orcidhttps://orcid.org/0000-0003-2691-1892
dc.identifier.orcidhttps://orcid.org/0000-0002-7512-3756
dc.identifier.orcidhttps://orcid.org/0000-0002-7244-3682
dc.identifier.orcidhttps://orcid.org/0000-0002-7184-5831
mit.licensePUBLISHER_CCen_US
mit.metadata.statusComplete


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