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dc.contributor.authorKumar, Nithin Senthur
dc.contributor.authorDel Vecchio, Domitilla
dc.date.accessioned2017-05-18T21:07:18Z
dc.date.available2017-05-18T21:07:18Z
dc.date.issued2016-08
dc.date.submitted2016-07
dc.identifier.isbn978-1-4673-8682-1
dc.identifier.issn2378-5861
dc.identifier.urihttp://hdl.handle.net/1721.1/109188
dc.description.abstractA significant problem when building complex biomolecular circuits is due to context-dependence: the dynamics of a system are altered upon changes to its context, potentially degrading the system's performance. Here, we study retroactivity, a specific type of context-dependence, by analyzing the effects of loads on a transcription factor applied by the transcription factor's target sites. In particular, we study this loading effect on the model of an activator-repressor oscillator, a widely studied motif in synthetic and systems biology. Our analysis indicates that strong activation and weak repression are key for a stable limit cycle. Repression can be effectively weakened by adding load to the repressor, while activation can be effectively weakened by adding load to the activator. Therefore, loading the repressor can be employed as a design parameter to establish a stable limit cycle. In contrast, loading the activator is deleterious to the clock.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ACC.2016.7526834en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT Web Domainen_US
dc.titleLoading as a design parameter for genetic circuitsen_US
dc.typeArticleen_US
dc.identifier.citationKumar, Nithin Senthur and Del Vecchio, Domitilla. “Loading as a Design Parameter for Genetic Circuits.” 2016 American Control Conference (ACC) July 6-8 2016, Boston, Massachusetts, Institute of Electrical and Electronics Engineers (IEEE), August 2016en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorKumar, Nithin Senthur
dc.contributor.mitauthorDel Vecchio, Domitilla
dc.relation.journalAmerican Control Conference (ACC), 2016en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsKumar, Nithin Senthur; Del Vecchio, Domitillaen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1161-6436
dc.identifier.orcidhttps://orcid.org/0000-0001-6472-8576
mit.licenseOPEN_ACCESS_POLICYen_US


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