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dc.contributor.authorOlechowski, Alison L
dc.contributor.authorEppinger, Steven D
dc.contributor.authorJoglekar, Nitindra
dc.date.accessioned2017-05-19T17:56:30Z
dc.date.available2017-05-19T17:56:30Z
dc.date.issued2015-09
dc.date.submitted2015-08
dc.identifier.isbn978-1-8908-4331-1
dc.identifier.isbn978-1-8908-4332-8
dc.identifier.urihttp://hdl.handle.net/1721.1/109222
dc.description.abstractThe technology readiness level (TRL) scale was introduced by NASA in the 1970s as a tool for assessing the maturity of technologies during complex system development. TRL data have been used to make multi-million dollar technology management decisions in programs such as NASA's Mars Curiosity Rover. This scale is now a de facto standard used for technology assessment and oversight in many industries, from power systems to consumer electronics. Low TRLs have been associated with significantly reduced timeliness and increased costs across a portfolio of US Department of Defense programs. However, anecdotal evidence raises concerns about many of the practices related to TRLs. We study TRL implementations based on semi-structured interviews with employees from seven different organizations and examine documentation collected from industry standards and organizational guidelines related to technology development and demonstration. Our findings consist of 15 challenges observed in TRL implementations that fall into three different categories: system complexity, planning and review, and validity of assessment. We explore research opportunities for these challenges and posit that addressing these opportunities, either singly or in groups, could improve decision processes and performance outcomes in complex engineering projects.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/PICMET.2015.7273196en_US
dc.rightsCreative Commons Attribution-NonCommercial 4.0 Internationalen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc/4.0/en_US
dc.sourceMIT Web Domainen_US
dc.titleTechnology readiness levels at 40: A study of state-of-the-art use, challenges, and opportunitiesen_US
dc.typeArticleen_US
dc.identifier.citationOlechowski, Alison; Eppinger, Steven D. and Joglekar, Nitin. “Technology Readiness Levels at 40: A Study of State-of-the-Art Use, Challenges, and Opportunities.” 2015 Portland International Conference on Management of Engineering and Technology (PICMET), August 2-6 2015, Institute of Electrical and Electronics Engineers (IEEE), September 2015 © Institute of Electrical and Electronics Engineers (IEEE)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Institute for Data, Systems, and Societyen_US
dc.contributor.departmentSloan School of Managementen_US
dc.contributor.mitauthorOlechowski, Alison L
dc.contributor.mitauthorEppinger, Steven D
dc.contributor.mitauthorJoglekar, Nitindra
dc.relation.journal2015 Portland International Conference on Management of Engineering and Technology (PICMET)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsOlechowski, Alison; Eppinger, Steven D.; Joglekar, Nitinen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-5557-654X
dc.identifier.orcidhttps://orcid.org/0000-0001-5747-8134
mit.licensePUBLISHER_CCen_US


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