dc.contributor.author | Ueland, Stian Melhus | |
dc.contributor.author | Schuh, Christopher A | |
dc.date.accessioned | 2017-05-30T14:13:56Z | |
dc.date.available | 2017-05-30T14:13:56Z | |
dc.date.issued | 2014-02 | |
dc.date.submitted | 2014-02 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/109408 | |
dc.description.abstract | Superelasticity in Cu–Zn–Al shape memory alloy microwires is studied as a function of surface roughness. Wires with a rough surface finish dissipate more than twice as much energy per unit volume during a superelastic cycle than do electropolished wires with smooth surfaces. We attribute the increased damping in wires with large surface roughness to the increased density of surface obstacles where frictional energy is dissipated as heat during martensitic phase transformation. | en_US |
dc.description.sponsorship | United States. Army Research Office. Institute for Soldier Nanotechnologies | en_US |
dc.language.iso | en_US | |
dc.publisher | Elsevier | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1016/j.scriptamat.2014.02.017 | en_US |
dc.rights | Creative Commons Attribution-NonCommercial-NoDerivs License | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | en_US |
dc.source | Prof. Schuh via Angie Locknar | en_US |
dc.title | Surface Roughness-Controlled Superelastic Hysteresis in Shape Memory Microwires | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Ueland, Stian M. and Christopher A. Schuh. "Surface Roughness-Controlled Superelastic Hysteresis in Shape Memory Microwires." Scripta Materialia 82 (2014): 1-4. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
dc.contributor.approver | Schuh, Christopher | en_US |
dc.contributor.mitauthor | Ueland, Stian Melhus | |
dc.contributor.mitauthor | Schuh, Christopher A | |
dc.relation.journal | Scripta Materialia | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Ueland, Stian M. ; Schuh, Christopher A. | en_US |
dspace.embargo.terms | N | en_US |
dc.identifier.orcid | https://orcid.org/0000-0001-9856-2682 | |
mit.license | PUBLISHER_CC | en_US |
mit.metadata.status | Complete | |