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dc.contributor.authorPandya, Shishir
dc.contributor.authorWilbur, Joshua D.
dc.contributor.authorDamodaran, Anoop R.
dc.contributor.authorMonachon, Christian
dc.contributor.authorDasgupta, Arvind
dc.contributor.authorKing, William P.
dc.contributor.authorDames, Chris
dc.contributor.authorMartin, Lane W.
dc.contributor.authorBhatia, Bikramjit S
dc.date.accessioned2017-06-02T23:07:00Z
dc.date.available2017-06-02T23:07:00Z
dc.date.issued2017-03
dc.date.submitted2017-02
dc.identifier.issn2331-7019
dc.identifier.urihttp://hdl.handle.net/1721.1/109576
dc.description.abstractAn understanding of polarization-heat interactions in pyroelectric and electrocaloric thin-film materials requires that the electrothermal response is reliably characterized. While most work, particularly in electrocalorics, has relied on indirect measurement protocols, here we report a direct technique for measuring both pyroelectric and electrocaloric effects in epitaxial ferroelectric thin films. We demonstrate an electrothermal test platform where localized high-frequency (approximately 1 kHz) periodic heating and highly sensitive thin-film resistance thermometry allow the direct measurement of pyrocurrents (<10 pA) and electrocaloric temperature changes (<2 mK) using the “2-omega” and an adapted “3-omega” technique, respectively. Frequency-domain, phase-sensitive detection permits the extraction of the pyrocurrent from the total current, which is often convoluted by thermally-stimulated currents. The wide-frequency-range measurements employed in this study further show the effect of secondary contributions to pyroelectricity due to the mechanical constraints of the substrate. Similarly, measurement of the electrocaloric effect on the same device in the frequency domain (at approximately 100 kHz) allows for the decoupling of Joule heating from the electrocaloric effect. Using one-dimensional, analytical heat-transport models, the transient temperature profile of the heterostructure is characterized to extract pyroelectric and electrocaloric coefficients.en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevApplied.7.034025en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleDirect Measurement of Pyroelectric and Electrocaloric Effects in Thin Filmsen_US
dc.typeArticleen_US
dc.identifier.citationPandya, Shishir et al. “Direct Measurement of Pyroelectric and Electrocaloric Effects in Thin Films.” Physical Review Applied 7.3 (2017): n. pag. © 2017 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorBhatia, Bikramjit S
dc.relation.journalPhysical Review Applieden_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2017-03-28T22:00:05Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1537-3080
mit.licensePUBLISHER_POLICYen_US


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