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Topological Darkness of Tamm Plasmons for High-Sensitivity Singular-Phase Optical Detection

dc.contributor.authorBoriskin, Victor N.
dc.contributor.authorSemenov, Alexander
dc.contributor.authorAyzatskiy, Mykola I.
dc.contributor.authorMachekhin, Yuri P.
dc.contributor.authorBoriskina, Svetlana V
dc.contributor.authorTong, Jonathan K.
dc.contributor.authorTsurimaki, Yoichiro
dc.contributor.authorChen, Gang
dc.date.accessioned2017-06-05T17:12:19Z
dc.date.available2017-06-05T17:12:19Z
dc.date.issued2016-10
dc.identifier.isbn978-1-943580-19-4
dc.identifier.urihttp://hdl.handle.net/1721.1/109593
dc.description.abstractMultilayered photonic-plasmonic structures exhibit topologically protected zero reflection if they are designed to support Tamm plasmon modes. Sharp phase changes associated with the Tamm mode excitation dramatically improve sensitivity of detectors.en_US
dc.language.isoen_US
dc.publisherOptical Society, Theen_US
dc.relation.isversionofhttps://doi.org/10.1364/FIO.2016.FW2E.2en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceBoriskinaen_US
dc.titleTopological Darkness of Tamm Plasmons for High-Sensitivity Singular-Phase Optical Detectionen_US
dc.typeArticleen_US
dc.identifier.citationBoriskina, Svetlana V.; Tong, Jonathan; Tsurimaki, Yoichiro; Boriskin, Victor N.; Semenov, Alexander; Ayzatskiy, Mykola I.; Machekhin, Yuri P. and Chen, Gang. “Topological Darkness of Tamm Plasmons for High-Sensitivity Singular-Phase Optical Detection.” Frontiers in Optics 2016, October 17-21 2016, Rochester, New York,The Optical Society, October 2016 © 2016 The Optical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.approverBoriskina, Svetlana V.en_US
dc.contributor.mitauthorBoriskina, Svetlana V
dc.contributor.mitauthorTong, Jonathan K.
dc.contributor.mitauthorTsurimaki, Yoichiro
dc.contributor.mitauthorChen, Gang
dc.relation.journalFrontiers in Optics 2016en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsBoriskina, Svetlana V.; Tong, Jonathan; Tsurimaki, Yoichiro; Boriskin, Victor N.; Semenov, Alexander; Ayzatskiy, Mykola I.; Machekhin, Yuri P.; Chen, Gangen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-3973-8067
dc.identifier.orcidhttps://orcid.org/0000-0001-7700-9175
dc.identifier.orcidhttps://orcid.org/0000-0002-3968-8530
mit.licenseOPEN_ACCESS_POLICYen_US


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