| dc.contributor.author | Nysteen, Anders | |
| dc.contributor.author | McCutcheon, Dara P. S. | |
| dc.contributor.author | Heuck, Mikkel | |
| dc.contributor.author | Mørk, Jesper | |
| dc.contributor.author | Englund, Dirk R. | |
| dc.date.accessioned | 2017-06-08T19:13:25Z | |
| dc.date.available | 2017-06-08T19:13:25Z | |
| dc.date.issued | 2017-06 | |
| dc.date.submitted | 2016-12 | |
| dc.identifier.issn | 2469-9926 | |
| dc.identifier.issn | 2469-9934 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/109755 | |
| dc.description.abstract | We investigate the origin of imperfections in the fidelity of a two-photon controlled-phase gate based on two-level-emitter nonlinearities. We focus on a passive system that operates without external modulations to enhance its performance. We demonstrate that the fidelity of the gate is limited by opposing requirements on the input pulse width for one- and two-photon-scattering events. For one-photon scattering, the spectral pulse width must be narrow compared with the emitter linewidth, while two-photon-scattering processes require the pulse width and emitter linewidth to be comparable. We find that these opposing requirements limit the maximum fidelity of the two-photon controlled-phase gate to 84% for photons with Gaussian spectral profiles. | en_US |
| dc.description.sponsorship | Danish Council for Independent Research (1325-00144) | en_US |
| dc.publisher | American Physical Society | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevA.95.062304 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | American Physical Society | en_US |
| dc.title | Limitations of two-level emitters as nonlinearities in two-photon controlled-phase gates | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Nysteen, Anders et al. “Limitations of Two-Level Emitters as Nonlinearities in Two-Photon Controlled-Phase Gates.” Physical Review A 95.6 (2017): n. pag. © 2017 American Physical Society | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.mitauthor | Heuck, Mikkel | |
| dc.relation.journal | Physical Review A | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dc.date.updated | 2017-06-05T22:00:07Z | |
| dc.language.rfc3066 | en | |
| dc.rights.holder | American Physical Society | |
| dspace.orderedauthors | Nysteen, Anders; McCutcheon, Dara P. S.; Heuck, Mikkel; Mørk, Jesper; Englund, Dirk R. | en_US |
| dspace.embargo.terms | N | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0001-7175-4473 | |
| mit.license | PUBLISHER_POLICY | en_US |
