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dc.contributor.authorChen, F.
dc.contributor.authorZhu, Y.
dc.contributor.authorLiu, S.
dc.contributor.authorQi, Y.
dc.contributor.authorQuirin, F.
dc.contributor.authorEnquist, H.
dc.contributor.authorZalden, P.
dc.contributor.authorHu, T.
dc.contributor.authorGoodfellow, J.
dc.contributor.authorSher, M.-J.
dc.contributor.authorHoffmann, M. C.
dc.contributor.authorZhu, D.
dc.contributor.authorLemke, H.
dc.contributor.authorGlownia, J.
dc.contributor.authorChollet, M.
dc.contributor.authorDamodaran, A. R.
dc.contributor.authorPark, J.
dc.contributor.authorCai, Z.
dc.contributor.authorJung, I. W.
dc.contributor.authorHighland, M. J.
dc.contributor.authorWalko, D. A.
dc.contributor.authorFreeland, J. W.
dc.contributor.authorEvans, P. G.
dc.contributor.authorVailionis, A.
dc.contributor.authorLarsson, J.
dc.contributor.authorRappe, A. M.
dc.contributor.authorSokolowski-Tinten, K.
dc.contributor.authorMartin, L. W.
dc.contributor.authorWen, H.
dc.contributor.authorLindenberg, A. M.
dc.contributor.authorHwang, Harold Y.
dc.contributor.authorBrandt, Nathaniel Curran
dc.contributor.authorLu, J.
dc.contributor.authorNelson, Keith Adam
dc.date.accessioned2017-06-08T19:29:01Z
dc.date.available2017-06-08T19:29:01Z
dc.date.issued2016-11
dc.date.submitted2016-10
dc.identifier.issn2469-9950
dc.identifier.issn2469-9969
dc.identifier.urihttp://hdl.handle.net/1721.1/109756
dc.description.abstractThe dynamical processes associated with electric field manipulation of the polarization in a ferroelectric remain largely unknown but fundamentally determine the speed and functionality of ferroelectric materials and devices. Here we apply subpicosecond duration, single-cycle terahertz pulses as an ultrafast electric field bias to prototypical BaTiO[subscript 3] ferroelectric thin films with the atomic-scale response probed by femtosecond x-ray-scattering techniques. We show that electric fields applied perpendicular to the ferroelectric polarization drive large-amplitude displacements of the titanium atoms along the ferroelectric polarization axis, comparable to that of the built-in displacements associated with the intrinsic polarization and incoherent across unit cells. This effect is associated with a dynamic rotation of the ferroelectric polarization switching on and then off on picosecond time scales. These transient polarization modulations are followed by long-lived vibrational heating effects driven by resonant excitation of the ferroelectric soft mode, as reflected in changes in the c-axis tetragonality. The ultrafast structural characterization described here enables a direct comparison with first-principles-based molecular-dynamics simulations, with good agreement obtained.en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.94.180104en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleUltrafast terahertz-field-driven ionic response in ferroelectric BaTiO[subscript 3]en_US
dc.title.alternativeUltrafast terahertz-field-driven ionic response in ferroelectric BaTiO3en_US
dc.typeArticleen_US
dc.identifier.citationChen, F. et al. “Ultrafast Terahertz-Field-Driven Ionic Response in Ferroelectric BaTiO 3.” Physical Review B 94.18 (2016): n. pag. © 2016 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.mitauthorHwang, Harold Y.
dc.contributor.mitauthorBrandt, Nathaniel Curran
dc.contributor.mitauthorLu, J.
dc.contributor.mitauthorNelson, Keith Adam
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2016-11-22T23:00:04Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsChen, F.; Zhu, Y.; Liu, S.; Qi, Y.; Hwang, H. Y.; Brandt, N. C.; Lu, J.; Quirin, F.; Enquist, H.; Zalden, P.; Hu, T.; Goodfellow, J.; Sher, M.-J.; Hoffmann, M. C.; Zhu, D.; Lemke, H.; Glownia, J.; Chollet, M.; Damodaran, A. R.; Park, J.; Cai, Z.; Jung, I. W.; Highland, M. J.; Walko, D. A.; Freeland, J. W.; Evans, P. G.; Vailionis, A.; Larsson, J.; Nelson, K. A.; Rappe, A. M.; Sokolowski-Tinten, K.; Martin, L. W.; Wen, H.; Lindenberg, A. M.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-7804-5418
mit.licensePUBLISHER_POLICYen_US


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