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dc.contributor.authorCavalli, Andrea
dc.contributor.authorMartin, David W.
dc.contributor.authorMiljkovic, Nenad
dc.contributor.authorBlanchette, Francois
dc.contributor.authorPreston, Daniel John
dc.contributor.authorTio, Evelyn
dc.contributor.authorWang, Evelyn
dc.contributor.authorBush, John W. M.
dc.date.accessioned2017-06-20T13:02:04Z
dc.date.available2017-06-20T13:02:04Z
dc.date.issued2016-02
dc.date.submitted2015-07
dc.identifier.issn1070-6631
dc.identifier.issn1089-7666
dc.identifier.urihttp://hdl.handle.net/1721.1/110034
dc.description.abstractA deformed droplet may leap from a solid substrate, impelled to detach through the conversion of surface energy into kinetic energy that arises as it relaxes to a sphere. Electrowetting provides a means of preparing a droplet on a substrate for lift-off. When a voltage is applied between a water droplet and a dielectric-coated electrode, the wettability of the substrate increases in a controlled way, leading to the spreading of the droplet. Once the voltage is released, the droplet recoils, due to a sudden excess in surface energy, and droplet detachment may follow. The process of drop detachment and lift-off, prevalent in both biology and micro-engineering, has to date been considered primarily in terms of qualitative scaling arguments for idealized superhydrophobic substrates. We here consider the eletrically-induced ejection of droplets from substrates of finite wettability and analyze the process quantitatively. We compare experiments to numerical simulations and analyze how the energy conversion efficiency is affected by the applied voltage and the intrinsic contact angle of the droplet on the substrate. Our results indicate that the finite wettability of the substrate significantly affects the detachment dynamics, and so provide new rationale for the previously reported large critical radius for drop ejection from micro-textured substrates.en_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.4940213en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT Web Domainen_US
dc.titleElectrically induced drop detachment and ejectionen_US
dc.typeArticleen_US
dc.identifier.citationCavalli, Andrea; Preston, Daniel J.; Tio, Evelyn; Martin, David W.; Miljkovic, Nenad; Wang, Evelyn N.; Blanchette, Francois and Bush, John W. M. “Electrically Induced Drop Detachment and Ejection.” Physics of Fluids 28, no. 2 (February 2016): 022101 © 2016 AIP Publishing LLCen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mathematicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorPreston, Daniel John
dc.contributor.mitauthorTio, Evelyn
dc.contributor.mitauthorWang, Evelyn
dc.contributor.mitauthorBush, John W. M.
dc.relation.journalPhysics of Fluidsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsCavalli, Andrea; Preston, Daniel J.; Tio, Evelyn; Martin, David W.; Miljkovic, Nenad; Wang, Evelyn N.; Blanchette, Francois; Bush, John W. M.en_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-7045-1200
dc.identifier.orcidhttps://orcid.org/0000-0002-7936-7256
mit.licensePUBLISHER_POLICYen_US


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