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dc.contributor.authorLee, Ho Nyung
dc.contributor.authorLee, Yueh Lin
dc.contributor.authorLee, Dongkyu
dc.contributor.authorWang, Xiao
dc.contributor.authorMorgan, Dane
dc.contributor.authorShao-Horn, Yang
dc.date.accessioned2017-07-11T13:12:49Z
dc.date.available2017-07-11T13:12:49Z
dc.date.issued2015-12
dc.identifier.issn1948-7185
dc.identifier.urihttp://hdl.handle.net/1721.1/110615
dc.description.abstractThrough alignment of theoretical modeling with experimental measurements of oxygen surface exchange kinetics on (001)-oriented La[subscript 2–x]Sr[subscript x]MO[subscript 4+δ] (M = Co, Ni, Cu) thin films, we demonstrate here the capability of the theoretical bulk O 2p-band centers to correlate with oxygen surface-exchange kinetics of the Ruddlesden–Popper oxide (RP[subscript 214]) (001)-oriented thin films. In addition, we demonstrate that the bulk O 2p-band centers can also correlate with the experimental activation energies for bulk oxygen transport and oxygen surface exchange of both the RP[subscript 214] and the perovskite polycrystalline materials reported in the literature, indicating the effectiveness of the bulk O 2p-band centers in describing the associated energetics and kinetics. We propose that the opposite slopes of the bulk O 2p-band center correlations between the RP[subscript 214] and the perovskite materials are due to the intrinsic mechanistic differences of their oxygen surface exchange kinetics and bulk anionic transport.en_US
dc.description.sponsorshipUnited States. Department of Energy. Solid State Energy Conversion Allianc (Core Technology Program Funding Opportunity Number DEFE0009435)en_US
dc.description.sponsorshipSkoltech-MIT Center for Electrochemical Energyen_US
dc.description.sponsorshipOak Ridge National Laboratory. Scientific User Facilities Divisionen_US
dc.description.sponsorshipUnited States. Department of Energy. Office of Basic Energy Science. Division of Materials Sciences and Engineeringen_US
dc.description.sponsorshipNational Energy Research Scientific Computing Center (U.S.) (grant number CNMS2013-292)en_US
dc.language.isoen_US
dc.publisherAmerican Chemical Society (ACS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/acs.jpclett.5b02423en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceProf. Shao-Horn via Angie Locknaren_US
dc.titleKinetics of Oxygen Surface Exchange on Epitaxial Ruddlesden–Popper Phases and Correlations to First-Principles Descriptorsen_US
dc.typeArticleen_US
dc.identifier.citationLee, Yueh-Lin, Dongkyu Lee, Xiao Renshaw Wang, Ho Nyung Lee, Dane Morgan, and Yang Shao-Horn. “Kinetics of Oxygen Surface Exchange on Epitaxial Ruddlesden–Popper Phases and Correlations to First-Principles Descriptors.” The Journal of Physical Chemistry Letters 7, no. 2 (January 21, 2016): 244–249.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Electrochemical Energy Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.approverShao-Horn, Yangen_US
dc.contributor.mitauthorLee, Yueh Lin
dc.contributor.mitauthorLee, Dongkyu
dc.contributor.mitauthorWang, Xiao
dc.contributor.mitauthorMorgan, Dane
dc.contributor.mitauthorShao-Horn, Yang
dc.relation.journalThe Journal of Physical Chemistry Lettersen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLee, Yueh-Lin; Lee, Dongkyu; Wang, Xiao Renshaw; Lee, Ho Nyung; Morgan, Dane; Shao-Horn, Yangen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-2477-6412
dc.identifier.orcidhttps://orcid.org/0000-0002-5503-9899
mit.licensePUBLISHER_POLICYen_US


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