dc.contributor.author | Heshmat Dehkordi, Barmak | |
dc.contributor.author | Ikoma, Hayato | |
dc.contributor.author | Lee, Ik Hyun | |
dc.contributor.author | Rastogi, Krishna | |
dc.contributor.author | Raskar, Ramesh | |
dc.date.accessioned | 2017-07-17T14:38:15Z | |
dc.date.available | 2017-07-17T14:38:15Z | |
dc.date.issued | 2015-03 | |
dc.identifier.issn | 0277-786X | |
dc.identifier.issn | 1996-756X | |
dc.identifier.uri | http://hdl.handle.net/1721.1/110721 | |
dc.description.abstract | We take advantage of human hair specific geometry to visualize sparse submicron cuticle peelings with highly oblique tip-side illumination. We show that the statistics of these features can directly estimate hair quality in much lower magnifications (down to 20x) with less powerful objectives when the features themselves are below the system resolution. Our technique has strong potential for lower cost, portable, and autonomous hair diagnostic apparatuses. | en_US |
dc.language.iso | en_US | |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1117/12.2078027 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | SPIE | en_US |
dc.title | Computational hair quality categorization in lower magnifications | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Heshmat, Barmak et al. “Computational Hair Quality Categorization in Lower Magnifications.” Proceedings of SPIE, San Francisco, California, USA, 10 March, 2015. Vol. 9333., Edited by Adam Wax and Vadim Backman, SPIE, 2015. n.p. © 2015 SPIE | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Media Laboratory | en_US |
dc.contributor.department | Program in Media Arts and Sciences (Massachusetts Institute of Technology) | en_US |
dc.contributor.mitauthor | Heshmat Dehkordi, Barmak | |
dc.contributor.mitauthor | Ikoma, Hayato | |
dc.contributor.mitauthor | Lee, Ik Hyun | |
dc.contributor.mitauthor | Rastogi, Krishna | |
dc.contributor.mitauthor | Raskar, Ramesh | |
dc.relation.journal | Proceedings of SPIE--the Society of Photo-Optical Instrumentation Engineers | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
dspace.orderedauthors | Heshmat, Barmak; Ikoma, Hayato; Lee, Ik Hyun; Rastogi, Krishna; Raskar, Ramesh | en_US |
dspace.embargo.terms | N | en_US |
dc.identifier.orcid | https://orcid.org/0000-0003-0768-4815 | |
dc.identifier.orcid | https://orcid.org/0000-0002-3254-3224 | |
mit.license | PUBLISHER_POLICY | en_US |