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dc.contributor.authorHeshmat Dehkordi, Barmak
dc.contributor.authorIkoma, Hayato
dc.contributor.authorLee, Ik Hyun
dc.contributor.authorRastogi, Krishna
dc.contributor.authorRaskar, Ramesh
dc.date.accessioned2017-07-17T14:38:15Z
dc.date.available2017-07-17T14:38:15Z
dc.date.issued2015-03
dc.identifier.issn0277-786X
dc.identifier.issn1996-756X
dc.identifier.urihttp://hdl.handle.net/1721.1/110721
dc.description.abstractWe take advantage of human hair specific geometry to visualize sparse submicron cuticle peelings with highly oblique tip-side illumination. We show that the statistics of these features can directly estimate hair quality in much lower magnifications (down to 20x) with less powerful objectives when the features themselves are below the system resolution. Our technique has strong potential for lower cost, portable, and autonomous hair diagnostic apparatuses.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.2078027en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleComputational hair quality categorization in lower magnificationsen_US
dc.typeArticleen_US
dc.identifier.citationHeshmat, Barmak et al. “Computational Hair Quality Categorization in Lower Magnifications.” Proceedings of SPIE, San Francisco, California, USA, 10 March, 2015. Vol. 9333., Edited by Adam Wax and Vadim Backman, SPIE, 2015. n.p. © 2015 SPIEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Media Laboratoryen_US
dc.contributor.departmentProgram in Media Arts and Sciences (Massachusetts Institute of Technology)en_US
dc.contributor.mitauthorHeshmat Dehkordi, Barmak
dc.contributor.mitauthorIkoma, Hayato
dc.contributor.mitauthorLee, Ik Hyun
dc.contributor.mitauthorRastogi, Krishna
dc.contributor.mitauthorRaskar, Ramesh
dc.relation.journalProceedings of SPIE--the Society of Photo-Optical Instrumentation Engineersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsHeshmat, Barmak; Ikoma, Hayato; Lee, Ik Hyun; Rastogi, Krishna; Raskar, Rameshen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-0768-4815
dc.identifier.orcidhttps://orcid.org/0000-0002-3254-3224
mit.licensePUBLISHER_POLICYen_US


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