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dc.contributor.authorAcharya, Jayadev
dc.contributor.authorDaskalakis, Konstantinos
dc.contributor.authorKamath, Gautam Chetan
dc.date.accessioned2017-07-25T17:38:21Z
dc.date.available2017-07-25T17:38:21Z
dc.date.issued2015-12
dc.identifier.issn1049-5258
dc.identifier.urihttp://hdl.handle.net/1721.1/110838
dc.description.abstractGiven samples from an unknown discrete distribution p, is it possible to distinguish whether p belongs to some class of distributions C versus p being far from every distribution in C? This fundamental question has received tremendous attention in statistics, focusing primarily on asymptotic analysis, as well as in information theory and theoretical computer science, where the emphasis has been on small sample size and computational complexity. Nevertheless, even for basic properties of discrete distributions such as monotonicity, independence, logconcavity, unimodality, and monotone-hazard rate, the optimal sample complexity is unknown. We provide a general approach via which we obtain sample-optimal and computationally efficient testers for all these distribution families. At the core of our approach is an algorithm which solves the following problem: Given samples from an unknown distribution p, and a known distribution q, are p and q close in x[superscript 2]-distance, or far in total variation distance? The optimality of our testers is established by providing matching lower bounds, up to constant factors. Finally, a necessary building block for our testers and an important byproduct of our work are the first known computationally efficient proper learners for discrete log-concave, monotone hazard rate distributions.en_US
dc.language.isoen_US
dc.publisherNeural Information Processing Systems Foundationen_US
dc.relation.isversionofhttps://papers.nips.cc/paper/5839-optimal-testing-for-properties-of-distributionsen_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceNeural Information Processing Systems (NIPS)en_US
dc.titleOptimal testing for properties of distributionsen_US
dc.typeArticleen_US
dc.identifier.citationAcharya, Jayadev, Constantinos Daskalakis, and Gautam Kamath. "Optimal Testing for Properties of Distributions." Advances in Neural Information Processing Systems 28 (NIPS 2015), Montreal, Canada, 7-12 December, 2015. NIPS 2015.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorAcharya, Jayadev
dc.contributor.mitauthorDaskalakis, Konstantinos
dc.contributor.mitauthorKamath, Gautam Chetan
dc.relation.journalAdvances in Neural Information Processing Systems 28 (NIPS 2015)en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsAcharya, Jayadev; Daskalakis, Constantinos; Kamath, Gautamen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-6416-2904
dc.identifier.orcidhttps://orcid.org/0000-0002-5451-0490
dc.identifier.orcidhttps://orcid.org/0000-0003-0048-2559
mit.licensePUBLISHER_POLICYen_US


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