MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Sample-Optimal Fourier Sampling in Any Constant Dimension

Author(s)
Indyk, Piotr; Kapralov, Mikhail
Thumbnail
DownloadSample-optimal.pdf (422.6Kb)
OPEN_ACCESS_POLICY

Open Access Policy

Creative Commons Attribution-Noncommercial-Share Alike

Terms of use
Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/
Metadata
Show full item record
Abstract
We give an algorithm for ℓ[subscript 2]/ℓ[subscript 2] sparse recovery from Fourier measurements using O(k log N) samples, matching the lower bound of Do Ba-Indyk-Price-Woodruff'10 for non-adaptive algorithms up to constant factors for any k ≤ N [superscript 1-δ]. The algorithm runs in Õ(N) time. Our algorithm extends to higher dimensions, leading to sample complexity of Õd(k log N), which is optimal up to constant factors for any d = O(1). These are the first sample optimal algorithms for these problems. A preliminary experimental evaluation indicates that our algorithm has empirical sampling complexity comparable to that of other recovery methods known in the literature, while providing strong provable guarantees on the recovery quality.
Date issued
2014-12
URI
http://hdl.handle.net/1721.1/110932
Department
Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Journal
2014 IEEE 55th Annual Symposium on Foundations of Computer Science
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Indyk, Piotr, and Kapralov, Michael. “Sample-Optimal Fourier Sampling in Any Constant Dimension.” 2014 IEEE 55th Annual Symposium on Foundations of Computer Science, Philadelphia, Pennsylvania, USA, October 18-21 2014, Institute of Electrical and Electronics Engineers (IEEE), December 2014
Version: Original manuscript
ISBN
978-1-4799-6517-5
ISSN
0272-5428

Collections
  • MIT Open Access Articles

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.